A ate dynamic power management method

Abstract

An ATE dynamic power consumption management method comprises the following steps: (1) when a test program set starts to be run, whether there is an instrument switch sequence existing in a UUT test program set to be run is judged; (2) an automatic test program source code analysis is made, and test codes are checked one by one to see whether there is an instrument handle calling instruments; (3) a switching control module reads in an instrument switch sequence, self-checks related hardware resources according to instrument / equipment / component information in the instrument switch sequence, and judges whether the self-check result is normal; (4) the current UUT test program set is run, and whether there is a need to open / close the power supply of related instruments / equipment / components is judged; (5) whether to open the power supply of related instruments / equipment / components or to close the power supply of related instruments / equipment / components is judged; and (6) whether UUT test ends is judged, a correct report is generated if UUT test ends, or, the method returns to step (4). According to the invention, the average power consumption of test equipment is reduced, and the long-term reliability is improved.

Description

technical field [0001] The invention relates to a method for managing dynamic power consumption of ATE, in particular to a method for managing dynamic power consumption of ATE based on code prediction. Background technique [0002] General-purpose automatic test equipment accounts for an increasing share in the entire automatic test equipment market. In order to meet the requirements of multi-tasking testing, general-purpose ATE will integrate a large number of reusable hardware test resources, but not all test resources are used in the entire test process. will be used in . [0003] At present, the usual situation is that, no matter which instruments, equipment and subsystems will be used in the subsequent test process, the general automatic test equipment will turn on and initialize the power supply of all instruments and equipment in the equipment at one time after power-on. In this way, if these test resources are not needed in the subsequent test process, it will cause...

AI Technical Summary

Problems solved by technology

In this way, if these test resources are not used in the subsequent test process, it will cause waste and reduce the service life of the equipment

Due to the low level of equipment integration in the past, it is not sensitive to power consumption, heat dissipation and other indicators, but the new generation of ATE integration level is getting higher and higher, and the extensive power consumption management method in the past is no longer applicable

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