An X-ray thickness gauge probe
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- MAANSHAN HENGRUI MEASURE EQUIP
- Publication Date
- 2018-04-10
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Abstract
Description
technical field
[0001] The invention relates to the technical field of thickness gauge probe structures, in particular to an X-ray thickness gauge probe. Background technique
[0002] Coating Thickness Gauge can non-destructively measure the thickness of non-magnetic coatings on magnetic metal substrates and the thickness of non-conductive coatings on non-magnetic metal substrates. The coating thickness gauge has the characteristics of small measurement error, high reliability, good stability, and easy operation. It is an indispensable testing instrument for controlling and ensuring product quality. It is widely used in manufacturing, metal processing, chemical industry, Commodity inspection and other testing fields, and the probe of the coating thickness gauge is the most important part, which affects the measurement efficiency and measurement accuracy. The existing thickness gauge probe has complex structure and poor anti-interference ability, which is easy to cause measu...