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An X-ray thickness gauge probe

A thickness gauge and X-ray technology, applied in the field of thickness gauge probe structure, can solve problems affecting measurement accuracy, signal distortion, poor anti-interference ability, etc., achieve the effect of simple structure principle, prevent electromagnetic interference, and improve accuracy

Active Publication Date: 2018-04-10
MAANSHAN HENGRUI MEASURE EQUIP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The existing thickness gauge probe has a complex structure and poor anti-interference ability, which is easy to cause measurement errors, and the collected signals are still distorted, which affects the measurement accuracy

Method used

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  • An X-ray thickness gauge probe
  • An X-ray thickness gauge probe

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Embodiment Construction

[0012] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0013] see Figure 1-2 , the present invention provides a technical solution: an X-ray thickness gauge probe, including a metal outer shell 1, the metal outer shell 1 is respectively provided with a gas ionization chamber 2, a preamplifier board 3 and a high-voltage module 4, the The front end of the gas ionization chamber 2 is provided with a window 5, the gas ionization chamber 2 is connected to the preamplifier 3, the high voltage module 4 is electrically c...

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Abstract

The invention discloses an X-ray thickness gauge probe comprising a metal shell body which is internally provided with a gas ionization chamber, a preamplifier board, and a high-voltage module. The front end of the gas ionization chamber is provided with a window. The gas ionization chamber is connected with the preamplifier board. The high-voltage module is electrically connected with the gas ionization chamber. The preamplifier board is provided with a high-power and low-noise operational amplifier module. The probe further comprises a shielding device which is fixedly arranged outside the window. The probe is simple in structure principle, and can quickly detect the intensity of X-rays penetrating a steel board. The adopted high-power and low-noise operational amplifier module can stably amplify weak signals, and is of low distortion. In addition, as the shielding device is arranged outside the window, electromagnetic interference is prevented, and the accuracy of detection is improved.

Description

technical field [0001] The invention relates to the technical field of thickness gauge probe structures, in particular to an X-ray thickness gauge probe. Background technique [0002] Coating Thickness Gauge can non-destructively measure the thickness of non-magnetic coatings on magnetic metal substrates and the thickness of non-conductive coatings on non-magnetic metal substrates. The coating thickness gauge has the characteristics of small measurement error, high reliability, good stability, and easy operation. It is an indispensable testing instrument for controlling and ensuring product quality. It is widely used in manufacturing, metal processing, chemical industry, Commodity inspection and other testing fields, and the probe of the coating thickness gauge is the most important part, which affects the measurement efficiency and measurement accuracy. The existing thickness gauge probe has complex structure and poor anti-interference ability, which is easy to cause measu...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B15/02
CPCG01B15/02
Inventor 李蔚森朱卫民
Owner MAANSHAN HENGRUI MEASURE EQUIP
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