Small sample reliability evaluation method of ion thruster on the basis of performance degradation
A technology of ion thrusters and small samples, which is applied in the fields of instruments, special data processing applications, electrical digital data processing, etc. It can solve the problems of tight development cycle, long life test cannot be carried out, and long-life reliability analysis of ion thrusters. And other issues
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[0089] The present invention will be further described in detail below in conjunction with the accompanying drawings.
[0090] The present invention provides a method for analyzing the reliability of a very small sample of an ion thruster based on performance degradation, the flow chart of which is as follows Figure 4 Shown, the concrete realization of the inventive method comprises the following steps:
[0091] Step 1: Analyze the structural characteristics and main failure modes of the ion thruster, and select key performance parameters that affect its life. The specific implementation methods are as follows:
[0092] 1. The ion thruster has a complex structure and many failure modes. The key components that affect the operating life of the ion thruster are the grid system and cathode components. The main failure modes include electron backflow, failure of the accelerating grid structure, exhaustion of the emitter, heating Wire fusing and contact pole wear and so on. The ...
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