A laser chip p-i curve kink test method and device
A P-I and chip technology, which is used in measuring devices, optical instrument testing, and optical performance testing, etc., can solve the problems of inaccurate judgment of the P-I curve of laser chips, and achieve the effect of improving efficiency and accuracy
Active Publication Date: 2019-01-01
HISENSE BROADBAND MULTIMEDIA TECH
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[0005] The present invention provides a laser chip P-I curve kink test method and device, which are used to solve the problem of inaccurate judgment on whether the laser chip P-I curve has a kink phenomenon existing in the prior art
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[0022] In order to make the purpose, technical solutions and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings. Obviously, the described embodiments are only some of the embodiments of the present invention, rather than all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0023] The embodiments of the present invention will be further described in detail below in conjunction with the accompanying drawings.
[0024] Such as figure 2 As shown, the laser chip P-I curve kink test method provided by the embodiment of the present invention includes:
[0025] Step 201, obtaining multiple output optical powers of the laser chip;
[0026] Step 202, according to the sample number L in the preset Savitzky-Golay ...
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The present invention relates to the field of semiconductor technology, in particular to a laser chip P-I curve kink test method and device, comprising: obtaining a plurality of output optical powers of the laser chip, and determining at least one target output optical power according to the Savitzky-Golay algorithm, For each target output optical power, according to the L output optical powers and the first-order differential convolution coefficient, determine the slope corresponding to the target output optical power, and then judge whether there is a kink in the P-I curve of the laser chip. This method uses the first-order differential convolution coefficient to weight the L output optical powers to obtain the slope corresponding to the target output optical power, thus reducing the influence of the data error of part of the output optical power on the correctness of the slope calculation results, that is, realizing The output optical power is filtered, and the filtering process is completed simultaneously with the calculation of the slope, thus improving the efficiency and accuracy of judging whether there is a kink in the P-I curve of the laser chip.
Description
technical field [0001] The invention relates to the technical field of semiconductors, in particular to a laser chip P-I curve kink test method and device. Background technique [0002] The laser chip kink phenomenon refers to the nonlinear change of the optical power (P)-current (I) curve caused by the drop of optical power or jitter with the increase of the input current of the laser. The laser chip with kink phenomenon P-I curve such as figure 1 shown. From the perspective of application, it is hoped that the P-I curve has no kink, because this kink will seriously affect the coupling between the laser and the fiber, so the kink phenomenon can be found in advance during the kink test of the laser chip P-I curve, and the bad chips can be screened out. It is conducive to improving the yield of laser devices in the later stage and reducing material waste. [0003] In the prior art, by sampling multiple output optical powers and corresponding input currents, calculating the...
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IPC IPC(8): G01R31/26G01M11/02
CPCG01M11/0292G01R31/2603
Inventor 马军涛
Owner HISENSE BROADBAND MULTIMEDIA TECH