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A touch panel for testing, deformation testing system and testing method

A touch panel, deformation testing technology, applied in the direction of instruments, computing, electrical digital data processing, etc., can solve problems such as damage to TP or TFT array substrates

Inactive Publication Date: 2018-10-30
BOE TECH GRP CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The embodiment of the present invention provides a touch panel for testing, a deformation testing system and a testing method, which are used to solve the problem of TP or TFT in the single-layer glass area caused by inaccurate filling foam thickness in the prior art. The problem of damage to the array substrate

Method used

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  • A touch panel for testing, deformation testing system and testing method
  • A touch panel for testing, deformation testing system and testing method
  • A touch panel for testing, deformation testing system and testing method

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Embodiment Construction

[0037] In order to make the purpose, technical solutions and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings. Obviously, the described embodiments are only some of the embodiments of the present invention, rather than all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0038] The technical solution involved in the present invention will be described in detail through specific examples below, and the present invention includes but is not limited to the following examples.

[0039] Such as figure 2 As shown, it is a schematic structural diagram of a test touch panel provided by an embodiment of the present invention. The test touch panel mainly includes:

[0040] The display panel 21, the touch contro...

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Abstract

The invention relates to the technical field of display, in particular to a touch panel for testing and a deformation testing system and method. The touch panel for testing and the deformation testing system and method are used for solving the problem that as the thickness of filled foam is inaccurate, TP or an array substrate is damaged in a single-glass area at present. In the embodiment, according to a gap area formed between the array substrate and a tough substrate, a face-shaped first electrode and a second electrode are arranged on the two substrates respectively, voltage signals are correspondingly applied, and the touch panel for testing can be serve as a template to be used for a drop test accordingly; according to the capacitance difference, reflected after stress is tested, between the first electrode and the second electrode, the hardness and the thickness of required filled supporting objects at all the positions of the gap area are determined. According to the scheme, the determined thickness of the supporting objects is more accurate, and as the compression ratio reflected through stress of the required supporting objects at the corresponding positions is considered, protection force of the gap area can be improved through the finally determined supporting objects.

Description

technical field [0001] The invention relates to the field of display technology, in particular to a touch panel for testing, a deformation testing system and a testing method. Background technique [0002] The demand in the touch panel market is concentrated and explosive. As various digital consumer electronics products are introduced into touch applications, the global touch panel market is rapidly growing. [0003] The touch panel is assembled from a traditional display panel and a touch panel (Touch Panel, TP). figure 1 As shown, after the TP is bonded to the display panel (which includes a CF substrate and a TFT array substrate), a single-layer glass region or a gap region (the rectangle dotted line frame region in the figure) is formed in the region opposite to the TFT substrate, and the TFT substrate in the gap region The integrated circuit IC and other unshown components are pasted on it; since the TP and TFT substrates in the single-layer glass area are relatively ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F3/044
CPCG06F3/044G06F2203/04105
Inventor 吴昊安娜刘旭忠罗宗玮次刚王寰宇
Owner BOE TECH GRP CO LTD