Single event effect detection method and system based on mirror backup

Abstract

The invention relates to a single event effect on-line detection method and system based on image backup, wherein the single event effect detection method based on image backup comprises the following steps of reading storage data in a tested device at the preset reading frequency when the tested device is in a dynamic test process to obtain current data; and when the current data is different from backup changing data in a position with the same unit address in an image device but is identical to the corresponding storage data, determining errors caused by the single event effect on a peripheral circuit. The method and the system have the advantages that simplicity and convenience are realized; the realization is easy; the comparability and the universality are high; the problem that when a conventional single event effect detection method is used, errors caused by the storage region turning and the peripheral circuit cannot be distinguished in the dynamic test process is solved; and for a storage class object, the single event effect sensitivity detection of complicated storage patterns can be realized.

Description

technical field [0001] The invention relates to the field of integrated circuit radiation effect testing, in particular to a single event effect detection method and system based on image backup. Background technique [0002] The space vehicle operates in the harsh natural radiation environment, and the single event effects (Single Event Effects, SEE) produced by high-energy protons, alpha particles and heavy ions in the space electronics system in the galactic cosmic rays, solar cosmic rays and geomagnetic field capture belts Serious threat to the safe operation of the spacecraft. According to the statistics of the National Geophysical Data Center of the United States, from 1971 to 1986, the total number of failures caused by various reasons in the 39 geostationary satellites launched by the United States was 1589 times, of which the single event upset (Single Event Upset, SEU) caused There were 621 failures, accounting for 39% of the total number of failures. The China A...

AI Technical Summary

Problems solved by technology

[0006] Based on this, it is necessary to provide an online single event effect detection method and system based on mirror backup to solve the problem that the traditional single event effect detection method cannot distinguish between storage area flipping and errors caused by peripheral circuits in dynamic testing.

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