Optical axis and mounting reference surface parallelism test device and method

A technology for installing benchmarks and testing devices, used in measuring devices, optical devices, instruments, etc., can solve the problems of difficult optical axis online adjustment, low degree of automation, low detection accuracy, etc., and achieve the effect of high longitude and convenient detection.

Inactive Publication Date: 2016-09-28
山东神戎电子股份有限公司
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Problems solved by technology

The traditional detection method has a low degree of automation, it is difficult to ach

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  • Optical axis and mounting reference surface parallelism test device and method
  • Optical axis and mounting reference surface parallelism test device and method
  • Optical axis and mounting reference surface parallelism test device and method

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[0026] The present invention will be further described below with reference to the drawings and embodiments.

[0027] Such as figure 1 As shown, the structure diagram of the parallelism test device for the optical axis and the installation reference plane of the present invention is given, which is composed of an optical collimation system 2, an up-conversion board 3, a CCD image sensor 4, an image capture card 5 and a computer 6. The optical axis of the optical collimation system 2 coincides with the optical axis of the CCD image sensor 4, and both are parallel to the installation reference plane of the laser illuminator. The up-conversion board 3 is located on the focal plane of the optical collimation system 2, and the optical collimation system 2 The laser spot emitted by the system under test 1 is focused on the up-conversion board 3, and the CCD image sensor 4 is composed of a CCD objective lens 7 and a CCD photosensitive surface 8. The up-conversion board 3 converts the ...

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Abstract

The invention relates to an optical axis and mounting reference surface parallelism test device. The device comprises an optical collimation system, a CCD image sensor, an image acquisition card and a computer, wherein a focal plane of the optical collimation system is provided with an upper conversion plate, laser spots are converted by the upper conversion plate into visible light spots, the visible light spots after conversion correspond to the original laser spots in one-to-one correspondence mode, parallelism test of a detected system is carried out through processing on the light spots, and calibration is further carried out. The invention further relates to a method. The method comprises steps that a), light spot image processing is carried out; b), a rectangular location zone of the light spots is determined; c), a light spot mass center is solved; d), an electric cross division center is queried; e), offset of the light spot mass center is solved; f), the offset amount is calculated; g), a magnifying power is calculated; and h), an offset included angle is acquired, and calibration is carried out. According to the device and the method, parallelism test and calibration of an optical axis of a laser illuminator are realized, and advantages of more convenient detection and high precision are realized compared with a detection method in the prior art.

Description

technical field [0001] The present invention relates to a device and method for testing the parallelism between the optical axis and the installation reference plane, more specifically, it relates to a parallelism test between the optical axis and the installation reference plane that converts invisible laser spots into visible light spots and then processes them Devices and methods. Background technique [0002] With the development of modern optoelectronic technology, optoelectronic systems are no longer the application of a single photoelectric sensor, but have formed a comprehensive application of system engineering, becoming a comprehensive application of multi-spectral, multi-sensor, and multi-optical path fusion, becoming a multi-spectral, multi-sensor , a modern integrated optoelectronic system with multi-optical integration. In this integrated optoelectronic system, the parallelism of the optical axis is an important index parameter. For a photoelectric system tha...

Claims

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Application Information

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IPC IPC(8): G01B11/26
CPCG01B11/26
Inventor 高倩丁鉴彬陶小凯
Owner 山东神戎电子股份有限公司
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