Method for direct quantitative measurement of binary mixed system by near infrared spectrum

A near-infrared spectroscopy and binary mixing technology is applied in the field of direct quantitative measurement of binary mixed systems by using near-infrared spectroscopy, which can solve the problems of difficult photometric values, complicated methods and high cost, and achieves convenient use, simple method and low work intensity. Effect

Inactive Publication Date: 2016-10-12
GUANGXI UNIVERSITY OF TECHNOLOGY
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Problems solved by technology

[0004] The technical problem to be solved by the present invention is to provide a method for directly quantitatively measuring binary mixed systems by using near-infrared spectr

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  • Method for direct quantitative measurement of binary mixed system by near infrared spectrum
  • Method for direct quantitative measurement of binary mixed system by near infrared spectrum
  • Method for direct quantitative measurement of binary mixed system by near infrared spectrum

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Embodiment 1

[0051] A method for directly quantitatively measuring the binary mixed system of cotton / viscose blended fibers by near-infrared spectroscopy, in the binary mixed system of cotton / viscose blended fibers, component a is viscose fiber, and component b is cotton fiber, Binary mixed system ab is cotton / viscose blended fiber, and the method comprises the following steps:

[0052] S1. Collect component a—near-infrared spectrum A of viscose fiber, component b—near-infrared spectrum B of cotton fiber, binary mixture system ab—near-infrared mixture of cotton / viscose blended fiber by spectrometer Spectrum AB, such as figure 1 , including the near-infrared spectrum A of pure viscose fiber and the near-infrared spectrum B of pure cotton fiber, and the cotton fiber content accounts for 10%, 20%, 30%, 40%, 50%, 60%, 70%, 80% The near-infrared mixed spectrum AB of the cotton / viscose blended fiber of %;

[0053] Select the 1480-1650nm band with relatively significant difference in the near-i...

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Abstract

Relating to a measurement method of a binary mixed system in the optical field, the invention provides a method for direct quantitative measurement of binary mixed system by near infrared spectrum. The method includes: collecting the near infrared spectrum of each component, establishing a moving window, selecting a near infrared spectrum B of a component b, moving the moving window from the left end of the near infrared spectrum B to the right, calculating the angle of the near infrared spectrum B and the angle of a near infrared mixed spectrum AB respectively to obtain a series of angle values, and calculating a variance D of the series of angle values; calculating the series variance Di of the near infrared spectrum B and a near infrared mixed spectrum AB under different content of the component b respectively; drawing a standard curve of different content of the component b and the series variance Di, and according to the standard curve, determining the ratio of component a and component b in the to-be-measured binary mixed system ab, thus realizing component quantification of the measured object. The method provided by the invention has the characteristics of simplicity, low cost, and low work intensity, can realize quantification without following a strict photometric value.

Description

technical field [0001] The invention relates to a method for measuring a binary mixing system in the optical field, in particular to a method for directly quantitatively measuring a binary mixing system by using near-infrared spectroscopy. Background technique [0002] The binary mixing system is a common system, for example, formula blending in chemical production, textile blending, food blending, etc. For a long time, the near-infrared spectroscopy analysis method has been used as a quantitative analysis method for the components of the binary mixed system, but the analysis results must rely on a large number of direct measurements of the system, and then based on the direct measurement values ​​and spectral measurements, carry out The secondary modeling method is complex and expensive, which limits the application of near-infrared spectroscopy analysis methods. [0003] Moreover, diffuse reflectance measurement is often used in near-infrared spectroscopy, and it is diffi...

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Application Information

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IPC IPC(8): G01N21/359
CPCG01N21/359
Inventor 姚志湘粟晖姚桔
Owner GUANGXI UNIVERSITY OF TECHNOLOGY
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