Supercharge Your Innovation With Domain-Expert AI Agents!

Etching apparatus

An etching device and etching technology, which are used in the manufacture of electrical components, printed circuits, and the removal of conductive materials by chemical/electrolytic methods, can solve problems such as reducing product production efficiency, and achieve the effect of improving efficiency, ensuring suction, and reliable support.

Inactive Publication Date: 2016-11-02
朴锺模
View PDF6 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, since the suction rod 40 directly contacts the substrate 50, in the case where the substrate 50 is a thin substrate having flexibility (for example, a flexible printed circuit (FPC) substrate), the substrate 50 may be sucked by the suction port 41 of the suction rod 40. is attached to the suction port 41
As a result, the transfer of the substrate 50 by the upper roller 30a and the lower roller 30b cannot be normally performed, thereby reducing product production efficiency.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Etching apparatus
  • Etching apparatus
  • Etching apparatus

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0057] Below, refer to Figure 3 to Figure 11A specific example of an etching device according to an embodiment of the present invention will be described. However, this is only an exemplary embodiment, and the present invention is not limited thereto.

[0058] In the process of describing the embodiments of the present invention, if it is considered that the specific description of the known technology related to the present invention may cause unnecessary confusion to the gist of the present invention, its detailed description will be omitted. In addition, the terms described below are all terms defined in consideration of the functions in the present invention, and may vary depending on the user's or operator's intention or custom. Therefore, it needs to be defined based on the contents throughout the specification.

[0059] The technical idea of ​​the present invention is determined by the scope of the claims, and the following examples are only a means to effectively ex...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present invention discloses an etching apparatus. An etching apparatus according to an embodiment of the present invention is an etching apparatus for etching an object to be processed, comprising: a chamber providing a space for performing the etching; one or more spraying portions located in the chamber and spraying an etching solution on the object to be processed, a plurality of transfer rollers for moving the object to be processed, an suction part for sucking the etching solution on an upper surface of the object to be processed, wherein the suction part comprises one or more suction pipes. Each transfer roller includes a rotary shaft and a plurality of support members formed along a longitudinal direction of the rotary shaft. Each suction pipe is located between a support member of one transfer roller and a support member adjacent to the transfer roller.

Description

technical field [0001] Embodiments of the present invention relate to an etching device, in particular, to an etching device capable of completely preventing puddling without hindering the movement of a flexible thin substrate. Background technique [0002] Generally, etching (etching) is a pattern shape processing method. After masking the required part on the surface of the material to be processed (such as a printed circuit board), spray chemical to the remaining part through the nozzle. Chemicals (such as etching solution) to form the desired shape, this method has recently been widely used in the semiconductor manufacturing process. [0003] The quality of the products manufactured according to this etching processing method is generally related to the etching solution and the etching device. Specifically, various conditions such as the type, temperature, concentration, etc. of the etching solution, and the shape, number, size, interval, arrangement, and moving speed o...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): C23F1/08H05K3/06
CPCC23F1/08H05K3/068
Inventor 朴锺模
Owner 朴锺模
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More