Compensation resistor testing circuit and method

Abstract

The invention relates to a compensation resistor testing circuit and method and belongs to the technical field of testing. The method comprises the following steps: a resistance value of a theoretical resistor R1 is calculated based on internal resistance Rr of a first return circuit, an adjustable resistor R is adjusted to be the theoretical resistor R1, and R1 equals R; when a second switch S2 is switched off and a first switch S2 and a third switch S3 are switched on, a preset current Isc2 is put into the testing circuit, and voltage V2 of a second return circuit is tested; based on the internal resistance Rr of the first return circuit, the voltage V2 of the second return circuit and the preset current Isc2, a resistance value of an actual resistor R1' is calculated; whether the theoretical resistance R1 is greater than the actual resistor R1' in resistance value is determined; when the theoretical resistance R1 is greater than the actual resistor R1' in resistance value, resistors R2 are connected in series in a branch circuit where the adjustable resistor R is placed; when the theoretical resistance R1 is smaller than the actual resistor R1' in resistance value, and resistors R2 are connected in parallel at two ends of the adjustable resistor R. Via the compensation resistor testing circuit and method, a phenomenon that circuit damage can be easily caused and a plurality of tests are required because a resistance value of the adjustable resistor needs to be adjusted manually for a plurality of times in the tests can be prevented; testing processes can be simplified.

Description

technical field [0001] The invention relates to circuit testing technology, in particular to a testing circuit and a testing method for compensating resistance. Background technique [0002] 10 specifications of high-precision wirewound resistors for 2 n The matrix arrangement constitutes 512 types of loaded loads. In the short-circuit measurement loop, using Ohm's law, under the specified voltage required by the standard or customer, the short-circuit current value of the specified demand is output by selecting a high-precision matrix resistance sequence. The testing process in the prior art is as follows: the expected short-circuit current waveform is debugged by using the copper column of the short-circuit test sample, and the short-circuit current value is controlled within a certain range under the tolerance range of the guaranteed voltage. This short-circuit current parameter needs to be manually adjusted many times, and can only be obtained after continuous modifica...

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Problems solved by technology

[0003] In the process of realizing the present invention, the inventor found that there are at least the following technical problems in the prior art: the first problem in the prior art is that manual adjustment and compensation of the resistance is required, and multiple short circuit approximation to the expected value adjustment is time-consuming and laborious. The efficiency is extremely low; and multiple direct high-current short-circuit adjustments will greatly damage the service life of the equipment, which will cause aging deviation and attenuation of the device, increase the uncertainty and difficulty of parameter adjustment, and increase the test cost

[0004] The second problem existing in the existing technology is that the short-circuit current adjustment tolerance is required to be controlled within a certain range, and this range is very large, which cannot meet the test requirements of some high-precision products today, and will misjudge the product

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