Capacitive tomographic method for sensitive field using coupled microwave imaging information
A technology of capacitance tomography and microwave imaging, which is used in material capacitance, material analysis by electromagnetic means, and material analysis, etc., can solve the problems of large difference in sensitive fields, low speed of reconstructed image solution, large reconstructed image error, etc.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0057] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with specific embodiments and with reference to the accompanying drawings. The following description of the embodiments of the present invention with reference to the accompanying drawings is intended to explain the general inventive concept of the present invention, but should not be construed as a limitation of the present invention.
[0058] Figure 5 Flowchart representing the electrical capacitance tomography method utilizing sensitive fields coupled to microwave imaging information. According to the general inventive concept of the present invention, a method for acquiring a sensitive field of electrical capacitance tomography coupled with microwave imaging information is provided, including steps:
[0059] S1: Obtain the Poisson equation of the electrical capacitance tomography system;
...
PUM
![No PUM](https://static-eureka.patsnap.com/ssr/23.2.0/_nuxt/noPUMSmall.5c5f49c7.png)
Abstract
Description
Claims
Application Information
![application no application](https://static-eureka.patsnap.com/ssr/23.2.0/_nuxt/application.06fe782c.png)
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com