Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Quick detection method for LTPS-IGZO glass substrate broken hole

A technology for glass substrates and detection methods, applied in measuring devices, material analysis through optical means, instruments, etc., can solve the problems of long detection time, low efficiency, and large subjective influence, and achieve low calculation time and defect detection. High-yield, reliable results

Inactive Publication Date: 2016-12-07
GUANGDONG UNIV OF TECH
View PDF7 Cites 15 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Aiming at the problems in the prior art of large-capacity, high-speed, high-performance medium LTPS / IGZO glass substrate defect detection, which take a long time to detect, have low efficiency, and are subject to subjective influence, the present invention proposes a fast detection method for holes in LTPS / IGZO glass substrates. Detection method, so as to quickly and automatically determine whether LTPS / IGZO is defective

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Quick detection method for LTPS-IGZO glass substrate broken hole
  • Quick detection method for LTPS-IGZO glass substrate broken hole
  • Quick detection method for LTPS-IGZO glass substrate broken hole

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0035] The accompanying drawings are for illustrative purposes only, and should not be construed as limiting the patent. The technical solutions of the present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0036] The invention provides a rapid detection method for holes in LTPS / IGZO glass substrates, see figure 1 , which includes the following steps:

[0037] Step 1: Image preprocessing. Due to the influence of mechanical vibration, shooting angle, optical distortion, etc., it is necessary to perform operations such as optical distortion processing, system vibration processing, image dynamic alignment, and sample plane correction on the collected images;

[0038] Step 2: Segment the region of interest, use the window cutting method to segment the preprocessed image. Such as figure 2 As shown, the input LPTS / IGZO glass substrate image is a large-capacity periodic complex image, which needs to be divided into small-...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a quick detection method for an LTPS-IGZO glass substrate broken hole. The method is characterized by mainly comprising the following steps that an LTPS-IGZO glass substrate image is acquired through a high-capacity high-speed parallel digital image acquisition technology; image preprocessing is conducted, wherein optical distortion processing of the image, system vibration processing, dynamic aligning of the image and binarization processing are included; the area of interest of the acquired image is segmented; image matching is conducted, wherein the images subjected to segmenting processing are quickly matched by establishing a standard template, and then a difference value between the acquired image and a standard image can be judged; defect determining is conducted. According to the method, a broken hole defect of the high-capacity LTPS-IGZO glass substrate image with the size of 1 G can be quickly detected, the defect detection rate is high, time consumed by calculation is short, the high-capacity and high-resolution picture processing speed is high, and performance is reliable.

Description

technical field [0001] The invention relates to the field of glass substrate defect detection, and more specifically, to a method for detecting hole defects in LTPS / IGZO glass substrates. Background technique [0002] In recent years, high-resolution display products represented by iPhone / iPad have developed rapidly, making the flat-panel display industry gradually develop in the direction of high-definition screen resolution, low power consumption, and flexibility. Compared with the traditional TFT-LCD panel, the pixel line width on the LTPS / IGZO panel is smaller and the circuit is more precise, which not only puts forward new requirements for the reliability and stability of the process, but also requires faster and higher resolution High-speed cameras are used to collect images, so the detection speed of product defect detection is getting faster and faster, and the product detection rate is getting higher and higher. Holes are relatively common defects in LTPS / IGZO glas...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/958
CPCG01N21/958
Inventor 程良伦林嘉华王涛
Owner GUANGDONG UNIV OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com