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Fast and accurate characterization method for living cell surface morphology atomic force microscope

An atomic force microscope and cell surface technology, which is applied in the field of cell research, can solve the problems of long recording data time, low measurement time resolution, and unsuitability for the research of rapid cell changes, and achieves less calculation, high time resolution, quick results

Active Publication Date: 2016-12-07
SHANGHAI JIAO TONG UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, this type of method often records data for a long time, resulting in low measurement time resolution, which is not suitable for the study of rapid cell changes.

Method used

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  • Fast and accurate characterization method for living cell surface morphology atomic force microscope
  • Fast and accurate characterization method for living cell surface morphology atomic force microscope
  • Fast and accurate characterization method for living cell surface morphology atomic force microscope

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Embodiment Construction

[0038] The specific embodiments of the present invention are given below in conjunction with the accompanying drawings, but the present invention is not limited to the following embodiments. Advantages and features of the present invention will be apparent from the following description and claims. It should be noted that all the drawings are in very simplified form and use imprecise ratios, which are only used for the purpose of conveniently and clearly assisting in describing the embodiments of the present invention.

[0039] Please refer to figure 1 , figure 1 Shown is a flow chart of the rapid and accurate characterization method of living cell atomic force microscopy in a preferred embodiment of the present invention. The present invention proposes a quick and accurate characterization method of living cell atomic force microscope, which includes the following steps:

[0040] Step 1 S100: using an atomic force microscope to obtain the force range where the cell surface...

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Abstract

The invention provides a fast and accurate characterization method for a living cell atomic force microscope. The method comprises the steps that the atomic force microscope is used to acquire the substantially stable applied force range of the cell surface elasticity value and the corresponding Young's modulus value; the atomic force microscope is used to acquire the back-and-forth scanning height image of a living cell under a set imaging force; force analysis is carried out on the interaction between a probe and the cell, and the interaction between the probe and the cell is decomposed into a vertical imaging force and a horizontal lateral force; and according to the imaging force magnitude, the cell surface topography under the force and the cell surface elasticity coefficient, the cell surface morphology of the cell without applied force is calculated. The fast and accurate characterization method for the living cell atomic force microscope has the advantages of high precision, high time resolution and the like.

Description

technical field [0001] The invention relates to a morphological characterization method in the field of cell research, and in particular to a fast and accurate characterization method for the atomic force microscope of the surface topography of living cells. Background technique [0002] Cells are the smallest functional unit of living organisms, and their properties (such as surface morphology, volume, etc.) are directly related to life processes. The detection and research of these cell properties have important biological and clinical significance. [0003] Atomic Force Microscope (AFM), an analytical instrument that can be used to study the surface structure of solid materials, including insulators. It studies the surface structure and properties of substances by detecting the extremely weak interatomic interaction between the surface of the sample to be tested and a miniature force-sensitive element. One end of a pair of microcantilever sensitive to weak force is fixed...

Claims

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Application Information

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IPC IPC(8): G01Q60/24
CPCG01Q60/24
Inventor 孙洁林沈轶邵志峰
Owner SHANGHAI JIAO TONG UNIV
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