Chip port frequency test method

Abstract

The invention provides a chip port frequency test method. The method comprises the steps that the frequency of the test vector of an output pin of a chip is defined, and the frequency matches the test frequency of an automatic test device (ATE); other test vectors are operated; and the test vector of the output pin is operated to carry out the chip port frequency test. According to the invention, when the test vector frequency exceeds the available maximum frequency of used ATE in a frequency test mode, the test vectors are divided to test the chip port output frequency through concurrent test technologies; the problems of hardware upgrade and additional cost of the existing first scheme are solved; the problem that other external test devices are needed in the existing second scheme is solved, and the problems of long test time and inconvenient hardware connection are solved; under the condition of unchanged ATE hardware, concurrent test technologies are used to test the higher frequency of a chip port; and the test convenience and the test efficiency of higher output frequency of the chip port are improved.

Description

technical field [0001] The invention relates to the field of chip testing, in particular to a chip port frequency testing method. Background technique [0002] In chip testing, port frequency testing is a very important part. When performing a port frequency test, the automatic test device (ATE) applies an input signal to the input port of the chip to allow the circuit to enter a corresponding working state, and then captures the response signal on the output port under test, and the ATE samples the output signal, and the calculation program Within a limited period of time t, the number of rising edges of the output signal is n, and the output frequency of the tested port is obtained as f=n / t, and f is compared with the expected output frequency value of the port, and if they are consistent, the output frequency of the port of the chip is judged Correct, if not consistent, it is judged that the output frequency of the port of the chip is abnormal. [0003] When testing the...

AI Technical Summary

Problems solved by technology

[0008] Existing technology 2: Do not use ATE to directly test the chip output port frequency. While running the test vector, use the ATE external oscilloscope to perform the output port frequency test; the communication between ATE and the external oscilloscope will lengthen the test time, and the external oscilloscope test is in the hardware It is not convenient to connect

[0009] To sum up, with the rapid development of integrated circuits, the frequency of its ports is getting higher and higher, and the use of existing technologies may increase the cost of testing or make it impossible to perform mass production testing efficiently.

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