Quantitative trend diagnosis method for failures of inner ring and outer ring of bearing
A diagnostic method, a technology for inner and outer rings, applied in the testing of mechanical bearings, measuring devices, and testing of mechanical components, etc., can solve the problems of complex internal structure and high failure rate
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0015] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments of the description
[0016] figure 1 It is a flowchart of the Sparsogram and Lempel-Ziv algorithm of the present invention. The principle of the fault quantitative diagnosis method will be described in detail below in conjunction with the flow chart.
[0017] (1) Perform i-level wavelet packet decomposition on the original signal of the same type of rolling bearing.
[0018] (2) Reconstruct all node coefficients of the i-th layer of the wavelet packet with the same length as the original signal, and use the coefficients of each wavelet packet node as the real part, and use the Hilbert transform of the wavelet packet node coefficients as the imaginary part to construct the analysis signal . Then, the modulus of the analysis signal is taken to obtain the envelope signal of the analysis signal. Then, calculate the power spectrum of the envelope s...
PUM

Abstract
Description
Claims
Application Information

- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com