Sapphire crystal ingot profile measuring device

A measurement device, sapphire technology, applied in the direction of measurement devices, optical devices, instruments, etc., can solve the problems of large and difficult shape measurement

Inactive Publication Date: 2017-01-11
江苏菲戈勒斯新材料科技有限公司
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  • Abstract
  • Description
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Problems solved by technology

However, due to the irregular shape of the sapphire boule and th

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  • Sapphire crystal ingot profile measuring device
  • Sapphire crystal ingot profile measuring device

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Embodiment Construction

[0014] The objects, features and characteristics of the present invention, as well as the operation method of the relevant elements of the structure and the function and combination of parts will become more apparent when reading the following description and the above claims with reference to the accompanying drawings. It is to be expressly understood that the drawings are for purposes of illustration and description only and are not intended as limitations of the invention.

[0015] figure 1 is a schematic diagram of a sapphire crystal ingot shape measuring device according to an embodiment of the present invention. Such as figure 1 As shown, two laterally moving slide rails 2 and a rotating table 3 are fixedly arranged on the base 1 . Wherein, two laterally moving slide rails 2 are arranged on opposite sides of the rotary table 3 , and the sapphire crystal ingot 4 to be measured is fixed on the rotary table 3 . The portal frame is vertically arranged on the base 1, where...

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Abstract

The invention discloses a sapphire crystal ingot profile measuring device. The device comprises a base, a rotating table, and a portal frame. The portal frame comprises two portals that are opposed to each other. The rotating table is disposed between the two portals. Each portal comprises two stand bars, a transmitter laser scan sensor and a receiver laser scan sensor. Each stand bar is vertically disposed on the base. Each transmitter laser scan sensor is slidingly disposed on one stand bar, and the receiver laser scan sensor is slidingly disposed on the other stand bar. A scan laser beam is formed between the transmitter laser scan sensor and the receiver laser scan sensor. The scan laser beam is used for scanning sizes of periphery and profile of a sapphire crystal ingot disposed on the rotating table from the top down and from different rotating angles, in order to reestablish 3D profile image of the sapphire crystal ingot with the help of interpolation algorithm. The device enables profile measurement of a sapphire crystal ingot in an efficient, reliable and accurate manner.

Description

technical field [0001] The invention relates to the technical field of profile measurement, in particular to a device for measuring the profile of a sapphire crystal ingot. Background technique [0002] At present, most of the sapphires used in the industry are materials produced by the Kyropoulos method. The shape of the sapphire crystal ingots grown in this way is irregular, so it is difficult to maximize the utilization when squaring. Due to the high cost of sapphire production, there is an urgent need for a method to improve the utilization rate of sapphire crystal ingots during square cutting, and to achieve the maximum utilization rate, measuring the profile of sapphire crystal ingots is the most basic condition. However, due to the irregular shape of the sapphire boule and the transparent material, there are great difficulties in profile determination. Contents of the invention [0003] The technical problem to be solved by the present invention is to provide a sap...

Claims

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Application Information

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IPC IPC(8): G01B11/24
Inventor 刘宇宁
Owner 江苏菲戈勒斯新材料科技有限公司
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