SRAM type fpga instantaneous ionizing radiation effect test system based on radiation avoidance

Abstract

The invention relates to a SRAM-type FPGA instantaneous ionizing radiation effect test system based on radiation avoidance, which adopts an FPGA instantaneous ionizing radiation effect test system that can initialize peripheral test circuits online. The impact of interference on the peripheral test circuit, and the effect test on the FPGA is completed after the radiation avoidance is over and the system is powered on again, which is suitable for the instantaneous ionizing radiation effect test. The invention proposes a SRAM-type FPGA instantaneous ionizing radiation effect test system based on radiation avoidance, which realizes system radiation avoidance, ensures the reliability of system initialization, and successfully realizes accurate and reliable testing of FPGA in an instantaneous ionizing radiation environment.

Description

SRAM FPGA Instantaneous Ionizing Radiation Effect Test System Based on Radiation Avoidance Technical field The invention belongs to an electronic component radiation effect test system, and relates to an SRAM type FPGA (hereinafter referred to as FPGA) instant ionizing radiation effect test system based on radiation avoidance. Background technique FPGA (Field Programmable Gate Arrays, Field Programmable Gate Arrays) is a programmable logic device with flexible application and fast speed. It has the advantage of online reconfiguration and has been widely used in space electronic systems and strategic weapon systems. In practical applications, FPGAs may encounter various radiation environments. Radiation (such as gamma rays, heavy ions, etc.) acting on the device may cause functional failures and endanger the normal operation of electronic systems. Therefore, the radiation effects of FPGAs have always been a hot research topic at home and abroad. The radiation effect test of ele...

AI Technical Summary

Problems solved by technology

However, so far, none of the existing FPGA test systems can achieve radiation avoidance

This is because: peripheral test circuit initialization information is generally stored in non-volatile memories such as EEPROM or PROM; unlike other devices that stop working in a power-off state, non-volatile memories still have to save data in a power-off state information, and these information may still be damaged by pulse interference in the power-off state during radiation avoidance, and cause initialization errors and test failures when the system is powered on again

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