A loop test system based on mipi D-PHY protocol

Abstract

The invention provides a loop test system based on an MIPI D-PHY protocol. The loop test system comprises a D-PHY controlled module, a D-PHY master control module, a loop module and a control module which are packaged in the same test piece; the D-PHY controlled module and the D-PHY master control module belong to different clock domains and are connected with the loop module through a PPI bus; the loop module receives and forwards data between the D-PHY controlled module and the D-PHY master control module through the PPI bus; and the control module is connected with the D-PHY controlled module, the D-PHY master control module and the loop module and controls parameter configuration of the D-PHY controlled module, the D-PHY master control module and the loop module. The test system well realizes a cross-clock-domain integrated test, at the same time, integrates two individually used chip modules into one test piece, and through such a design, simplifies the complexity of PHY chip verification.

Description

technical field [0001] The invention relates to the field of integrated circuit design, in particular to a loop test system based on the MIPI D-PHY protocol. Background technique [0002] MIPI is the abbreviation of Mobile Industry Processor Interface, that is, the mobile industry processor interface. D-PHY, one of the MIPI protocols, provides the definition of DSI (Serial Display Interface) and CSI (Serial Camera Interface) on the physical layer, and the data between the host and peripherals through physical interconnection It is a standardized protocol for the camera and display inside the mobile phone for management, error and communication. D-PHY uses 1 pair of source-synchronous differential clocks and 1 to 4 pairs of differential data lines for data transmission, and the data transmission adopts DDR mode. D-PHY has the following characteristics: [0003] 1. Support HS (High Speed) and LP (Low Power) two working modes; [0004] 2. Differential transmission can minim...

AI Technical Summary

Problems solved by technology

[0007] At present, in the process of tape-out testing, the main control and controlled chips are often tape-out separately. The test method is more flexible, but it will bring area consumption and increase the test time and labor costs.

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