Temperature control system and temperature control sample stage for atomic force microscope

Abstract

The invention discloses a temperature control system and a temperature control sample stage for an atomic force microscope. The temperature control sample stage comprises a stage panel, a sample pool and a temperature control chamber. The sample pool is arranged on the stage panel, and a temperature measurement joint is externally connected with a temperature measurement probe which is fixed in the sample pool. The temperature control chamber is arranged below the stage panel and is a cavity under the sample pool, and a semiconductor temperature control piece and a heat radiation coil are arranged in the temperature control chamber. The semiconductor temperature control piece is externally connected with a temperature control joint, and a water inlet joint and a water outlet joint are externally connected with the heat radiation coil. The temperature control system comprises a temperature measurement and control instrument, a peristaltic pump and the temperature control sample stage. The temperature measurement and control instrument is connected with the temperature measurement probe and the semiconductor temperature control piece, and the peristaltic pump is connected with the heat radiation coil. Due to a small size of the sample pool, quickness and convenience in temperature adjustment, precision in target temperature control and low energy consumption are realized.

Description

technical field [0001] The invention relates to an accessory under an atomic force microscope, in particular to a sample stage capable of regulating the temperature of a sample pool under the atomic force microscope. Background technique [0002] The atomic force microscope is a widely used scientific research instrument for observing the molecular-level properties of the sample surface and performing single-molecule force spectroscopy experiments. Temperature is a very important environmental factor when using AFM, since single-molecule force spectroscopy data are related to ambient temperature. Under the prior art, the ambient temperature control of the atomic force microscope is realized by controlling the large ambient temperature. For example, place the atomic force microscope in a room with adjustable temperature, or place the atomic force microscope in a sealed box with adjustable temperature. Regardless of the room or the sealed box, because there is too much space...

AI Technical Summary

Problems solved by technology

Regardless of whether it is indoors or in a sealed box, because there is too much space to adjust the temperature, it takes a long time to adjust the temperature to the target temperature, and the temperature adjustment is not accurate enough, and the energy consumption is high

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