Ageing test method and device of alternating-current luminous chips
A light-emitting chip and aging testing technology, which is applied in the direction of electronic circuit testing, etc., can solve the problems of the existence of testers, danger, and low test efficiency, and achieve the effect of improved test efficiency, high efficiency, and high safety performance
Inactive Publication Date: 2017-02-22
ZHONGSHAN ICBRIGHT TECH LTD
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Problems solved by technology
The existing test method is that the tester directly holds the test electrode to test the AC light-emitting chip. Since the alternating current is usually high voltage, the safety voltage exceeding 36V will cause potential danger to the tester. At the same time, only one AC light-emitting chip can be tested at a time. The test efficiency is not high, and the heat generated by the AC light-emitting chip during the test cannot be exported in time, and the accumulation of heat will affect the performance of the AC light-emitting chip
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[0014] refer to figure 1 , figure 2 , image 3 , an aging test method and device for an AC light-emitting chip disclosed in the present invention, comprising: a frame 1, a radiator 2 is installed in the frame 1, and a plurality of test platforms on which the tested light-emitting chip can be placed are arranged on the upper surface of the radiator 2 3. A fixed frame 5 is hinged on the frame 1 through a connecting piece 4 such as a hinge shaft. The fixed frame 5 can be fastened on the frame 1, and the surface of the fixed frame 5 opposite to the test platform 3 is provided with a number of thimbles 6. The frame 1 or The test circuit of the light-emitting chip can be set in the fixed frame 5, or the test circuit can also be placed outside the test device, the thimble 6 is electrically connected with the test circuit of the AC light-emitting chip, and the frame 1 is provided with a control switch 7 to control the opening of the test device or off.
[0015] During the test, th...
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The invention discloses an ageing test method and device of alternating-current luminous chips. The device comprises a frame, a radiator, a fixed frame and a cooling fan; the radiator is installed in the frame, and multiple test platforms capable of carrying tested luminous chips are arranged on the upper surface of the radiator; the fixed frame can be buckled on the frame, and multiple ejector pins are arranged on the surface, opposite to the test platforms, of the fixed frame; the radiator can be subjected to forced heat dissipation through the cooling fan. The ageing test method and device of the alternating-current luminous chips have the advantages of being safe, convenient and high in efficiency.
Description
technical field [0001] The invention relates to a testing method and device, in particular to a testing device for testing the aging time of an AC light-emitting chip. Background technique [0002] In the production of AC light-emitting chips, it is necessary to perform aging tests on the light-emitting chips, that is, to test the performance of the light-emitting chips such as their service life. The existing test method is that the tester directly holds the test electrode to test the AC light-emitting chip. Since the alternating current is usually high voltage, the safety voltage exceeding 36V will cause potential danger to the tester. At the same time, only one AC light-emitting chip can be tested at a time. The light-emitting chip is tested, and the test efficiency is not high. Moreover, the heat generated by the AC light-emitting chip during the test cannot be exported in time, and the accumulation of heat will affect the performance of the AC light-emitting chip. Ther...
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IPC IPC(8): G01R31/28
CPCG01R31/28
Inventor 李克坚桑钧晟
Owner ZHONGSHAN ICBRIGHT TECH LTD