A DDR timing analysis method, device and system

Abstract

Embodiments of the present invention disclose a method, device and system for DDR timing analysis, which solves the problem that the current DDR test method cannot measure the setup time and hold time of DDR, and it is difficult to test the worst setup time and hold time values, resulting in accurate testing. Low-level technical problems, and the use of Labview software to perform DDR timing analysis through a common oscilloscope, greatly reduces costs. The DDR timing analysis method according to the embodiment of the present invention includes: performing a read operation or a write operation on the DDR, and saving the DQ and DQS waveform diagrams of the DDR; using Labview software to perform a data separation operation on the DQ and DQS waveform diagrams, and removing three corresponding to the DQS signal. The corresponding eye diagram is formed for the DQS signal with the tri-state signal removed, and the timing of the DDR is determined according to the eye diagram.

Description

technical field [0001] The invention relates to the technical field of DDR testing, in particular to a DDR timing analysis method, device and system. Background technique [0002] DDR=Double Data Rate double rate synchronous dynamic random access memory. Strictly speaking, DDR should be called DDR SDRAM, and people are used to calling it DDR. Among them, SDRAM is the abbreviation of Synchronous Dynamic Random Access Memory, that is, synchronous dynamic random access memory. DDR SDRAM is the abbreviation of Double Data Rate SDRAM, which means double-rate synchronous dynamic random access memory. Now DDR technology has been developed to DDR 3, theoretically the speed can support up to 1600MT / s. The DDR bus has a large number of traces, high speed, complex operation, and difficult detection, which brings great challenges to testing and analysis. DDR essentially doubles the speed of SDRAM without increasing the clock frequency. It allows data to be read on the rising and fall...

AI Technical Summary

Problems solved by technology

[0005] A DDR timing analysis method, device, and system provided by the embodiments of the present invention solve the problem that the current DDR test method is difficult to test the worst set-up time and hold time values ​​when measuring the set-up time and hold time of DDR, resulting in accurate testing. Low-degree technical problems, and use Labview software to conduct DDR timing analysis through ordinary oscilloscopes, greatly reducing costs

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