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Cascade and point defect producing method based on charged particle irradiation

A technology of charged particles and point defects, which is applied in the direction of measuring devices, instruments, scientific instruments, etc., can solve problems such as the coexistence of point defects and cascading defects, and achieve the effect of reducing costs, simple steps, and easy operation

Active Publication Date: 2017-03-08
HARBIN INST OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Under space environmental conditions, due to the continuous energy spectrum of electrons and protons, it will lead to the coexistence of point defects and cascade defects

Method used

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  • Cascade and point defect producing method based on charged particle irradiation
  • Cascade and point defect producing method based on charged particle irradiation
  • Cascade and point defect producing method based on charged particle irradiation

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specific Embodiment approach 1

[0024] Specific implementation mode one: combine figure 1 Specifically explain this embodiment, a method for generating cascade and point defects based on charged particle irradiation described in this embodiment, the method includes the following steps:

[0025] Select charged particles;

[0026] Calculate the absorbed dose D of displacement damage per unit time generated by charged particles;

[0027] according to Calculate D'(E), D'(E) is the absorbed dose of displacement damage produced by a charged particle with energy E, is the injection rate;

[0028] Select effective charged particles whose D'(E) is greater than the generation threshold of displacement defects;

[0029] Selecting charged particles whose D is less than the threshold of point defects among the effective charged particles is used as an irradiation source to generate point defects;

[0030] Among the effective charged particles, the charged particles whose D is greater than the threshold of cascadin...

specific Embodiment approach 2

[0033] Embodiment 2: This embodiment is a further description of the method for generating cascade and point defects based on the irradiation of charged particles described in Embodiment 1. In this embodiment, the selected charged particles are electrons, protons or heavy ions.

specific Embodiment approach 3

[0034] Specific embodiment three: This embodiment is a further description of a method for generating cascade and point defects based on charged particle irradiation described in specific embodiment one or two. In this embodiment, Geant4 or SRIM software is used, according to The energy E and fluence rate of the selected charged particles Calculate the displacement damage absorbed dose D per unit time generated by the charged particles.

[0035] Geant4 or SRIM software is used for calculation, which is simple and accurate.

[0036] Geant4 is a Monte Carlo application software package developed by CERN (European Commission for Nuclear Research). It is mainly used to simulate the physical process of high-energy particle transport in the detector. It is written in object-oriented C++ language and can construct complex detector geometry. Structure, customize the model of the particle of interest and the physical process, and be able to track the process of the particle, display ...

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Abstract

The invention relates to a cascade and point defect producing method based on charged particle irradiation, relates to the field of the space environment effect and aims to meet the research requirement for the displacement damage effect. The method comprises steps as follows: charged particles are selected; the unit time displacement damage absorbed dose D produced by the charged particles is calculated; D'(E) which is the displacement damage absorbed dose produced by one charged particle with the energy as E is calculated, and phi is the fluence rate; effective charged particles with D'(E) larger than a displacement defect producing threshold are selected; charged particles with D smaller than a point defect threshold are selected from the effective charged particles to serve as irradiation sources to produce point defects; charged particles with D larger than a cascade defect threshold are selected from the effective charged particles to serve as irradiation sources to produce point defects and cascade defects. The method is applicable to production of the cascade and point defects.

Description

technical field [0001] The invention relates to the field of space environmental effects, in particular to the technology for generating cascade and point defects based on charged particle irradiation. Background technique [0002] In recent years, my country's aerospace industry has developed rapidly, and more and more materials and devices will be used in the space environment. Under the action of high-energy charged particles, the radiation damage of materials and devices will lead to their performance degradation. Therefore, it is necessary to study the formation and evolution mechanism of radiation damage defects in materials and devices. [0003] Radiation damage causes atoms in the target to break away from their normal lattice positions, resulting in damage to interstitial atoms and vacancies. In addition to these individual defects, more kinds of complex displacement recombination stable defects may be generated between vacancies and vacancies, between interstitia...

Claims

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Application Information

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IPC IPC(8): G01N17/00
CPCG01N17/00
Inventor 李兴冀杨剑群刘超铭马国亮
Owner HARBIN INST OF TECH
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