Diode surge performance testing circuit and control method thereof

Abstract

The invention provides a diode surge performance testing circuit and a control method thereof. The testing circuit comprises a charging unit, an RC resonant unit, a rectifying unit and a tested diode, and is characterized in that the RC resonant unit comprises a capacitor group and an inductor group which are connected in series, and the charging unit comprises a power supply and a charging switch which are connected in series; the RC resonant unit, the rectifying unit and the tested diode are connected in parallel; and the charging unit is connected with the capacitor group in parallel. The control method comprises the steps of closing the charging switch, and charging the capacitor group by the power supply; disconnecting the charging switch when voltage of the capacitor group reaches a preset value; controlling the RC resonant unit to output surge current to the tested diode; controlling the rectifying unit to perform a surge test on the surge current rectification; and closing an inverse voltage test switch when the surge test is finished so as to perform a withstand voltage test. Compared with the prior art, the diode surge performance testing circuit and the control method thereof provided by the invention can continuously output forward surge current to the tested diode so as to test the repetitive surface performance of the tested diode.

Description

Technical field [0001] The invention relates to the technical field of power electronic device testing, in particular to a diode surge performance test circuit and a control method thereof. Background technique [0002] With the rapid development of power electronic devices, the structure of the controllable device anti-connection diode is widely used in power systems, locomotive traction, industrial frequency conversion and other fields. Among them, the performance and reliability of the diode have an important influence on the working ability and stability of the system, so accurate and reasonable test technology is of great significance to the design and use of the diode and the system. [0003] At present, the performance test of the diode mainly includes tests such as dynamic and static parameters and surge current. Among them, the standard surge current test has been listed as a type test item by the relevant national standards, and the test method is relatively mature and c...

AI Technical Summary

Problems solved by technology

However, the standard surge current test is only suitable for the detection of single pulse surge current. At the same time, most of the diode test equipment in the prior art is standard surge test equipment, which cannot effectively test the reliability of power electronic devices passing continuous pulse surge current.

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