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Multi-angle three-dimensional contour measuring system and measuring method

A three-dimensional profile and measurement system technology, applied in the field of optical inspection, can solve the problems of time-consuming and laborious, and achieve the effect of high measurement accuracy, fast speed and large field of view

Inactive Publication Date: 2017-04-05
XIAN CHISHINE OPTOELECTRONICS TECH CO LTD
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AI Technical Summary

Problems solved by technology

[0003] At present, due to the limitation of the angle between the cameras of the binocular stereo vision measurement system, only an accurate 3D model within 90 degrees of an object can be obtained
In actual use, it is usually necessary to measure the same measurement object multiple times at different angles, and then stitch the obtained 3D contour models, which is time-consuming and laborious

Method used

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Embodiment Construction

[0039] The present invention is described in further detail below in conjunction with accompanying drawing:

[0040] see Figure 1-12, a multi-angle three-dimensional measurement system, the system consists of one or more cameras, a laser MEMS (Micro-electromechanical Systems) projection device and two mirrors, the laser MEMS projection device is placed directly above the measured object, and the mirrors are symmetrical Placed on both sides of the measured object and at a certain angle with the measured object, so that the left and right sides of the measured object are imaged in the mirror, the camera can collect the left and right sides of the measured object through the left and right mirrors, and also The front surface of the measured object can be collected, that is, the 360-degree contour features of the measured object can be collected. The projection field of view of the laser MEMS projection device is divided into three areas: A, B, and C. Area A is the field of view...

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Abstract

The invention discloses a multi-angle three-dimensional contour measuring system and measuring method. The method comprises steps of: 1) acquiring three regions to reconstruct the coordinate transformation relation of a model by using three-dimensional calibration technique for the point cloud splicing; 2) projecting coded structured light and acquiring a structured light picture modulated by a measured object; 3) performing matching in order to solve parallax; 4) performing three-dimensional reconstruction, obtaining the three-dimensional contour of the front surface and the left and right side surfaces of the measured object; 5) performing point cloud low-precision splicing to get the low-precision multi-angle three-dimensional contour of the measured object; 6) performing high-precision splicing by using ICP to ultimately get high-precision multi-angle three-dimensional contour of the measured objects. The multi-angle three-dimensional contour measuring system can obtain the accurate three-dimensional model of the measured object in 360 degrees under the condition that the measured object and a measuring angle are fixed, and has the advantages of simple structure, high measurement precision, large field of view and fast speed.

Description

Technical field: [0001] The invention belongs to the field of optical detection, and relates to a three-dimensional contour multi-angle optical detection system and detection method, in particular to a structured light three-dimensional measurement method with a large depth of field, multiple angles and a large field of view. Background technique: [0002] Three-dimensional scanning technology is more and more widely used. In order to realize fast and accurate three-dimensional measurement of objects, the stereo vision method of multi-camera shooting and the structured light method of fringe projection are usually used. The traditional phase-shift profilometry method can measure objects with any curved surface shape and has a wide measurement range, but this method has calibration difficulties and reflectivity problems; the binocular stereo vision method has a simple measurement system but has problems with matching difficulties. If these two methods are combined, using the ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/25
CPCG01B11/2513
Inventor 金瑞王超李欢欢车玉彩郭迪姚东
Owner XIAN CHISHINE OPTOELECTRONICS TECH CO LTD
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