Testing device of four-quadrant detecting photoelectric system, and adjusting and testing method
A four-quadrant detection and photoelectric system technology, applied in measuring devices, optical instrument testing, machine/structural component testing, etc., can solve problems such as difficult installation and adjustment of the optical axis, complicated installation and adjustment process, and inability to accurately locate the mechanical axis
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[0024] The present invention will be further elaborated below by describing a preferred specific embodiment in detail in conjunction with the accompanying drawings.
[0025] Such as figure 1 As shown, a test device for a four-quadrant detection photoelectric system, including: a four-quadrant detection photoelectric system and a test cabinet;
[0026] The four-quadrant detection photoelectric system includes:
[0027] Standard light source 1, the standard light source 1 emits a test beam to form a collimated light path through the collimator 2, and irradiates on the test piece 6;
[0028] The test piece 6 is arranged on a test platform 3 provided with a photoelectric receiver;
[0029] The test platform 3 is arranged on the optical platform 5, and the optical platform 5 is calibrated to make it perpendicular to the optical axis of the test beam emitted by the collimator 2;
[0030] The test platform 3 is electrically connected to the test cabinet 4, and receives and execute...
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