Magneto-electro-thermo multi-parameter coupling microscope probe, and preparation method and detection method thereof

Abstract

The invention provides a magneto-electro-thermo multi-parameter coupling microscope probe. The probe comprises a probe arm and a needle point body connected with the probe arm, the surface of the probe arm and the needle point body is outwardly covered by a metal thermal resistance layer, a heat conduction insulating layer and a magnetic conducting layer in sequence, the metal thermal resistance layer and an external circuit form a thermoelectric circuit, and the magnetic conducting layer, a sample and the external circuit form a conduction circuit. According to the probe, the structure is simple, the preparation difficulty is low, in-situ micro-area detection of magnetic signals, electric signals, and thermal signals of a magneto-electric function material can be conducted, and the signal interference between the thermoelectric circuit and the conduction circuit can be effectively avoided.

Description

technical field [0001] The invention relates to a probe of a scanning probe microscope, in particular to a magnetic-electric-thermal multi-parameter coupled microscope probe, a preparation method and a detection method thereof. Background technique [0002] In recent years, nanoscience and technology are ushering in unprecedented rapid development. The preparation, characterization and measurement technology of nanomaterials have received more and more attention, and the corresponding instruments have also received extensive attention and rapid development. [0003] As a new type of microscopic tool, scanning probe microscope is playing an increasingly important role. Scanning probe microscopes are developed on the basis of scanning tunneling microscopes, and various new probe microscopes have been further developed. It has the advantages of extremely high resolution, real-time observation, and a relaxed use environment, and is widely applicable to various Scientific experi...

AI Technical Summary

Problems solved by technology

[0006] However, the structure of the probe has the following disadvantages: (1) The structure is complex and difficult to prepare; (2) The first film and the third film are connected at the tip of the needle, which causes the two signals to easily interact with each other when detecting the thermal signal and the conductive signal at the same time. interference

However, in this structure, the thermal resistance layer is directly connected to the magnetoelectric layer, which still does not avoid the interference of thermal signals and electrical signals.

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