A wireless test calibration method based on k-means algorithm

Abstract

The present invention relates to the field of wireless testing, in particular to a wireless testing calibration method based on the K-means algorithm, comprising the following steps: Step 1, by analyzing a large amount of previous data of the same circuit board, the difference between each channel is counted; Step 2: Use the K-means algorithm to cluster and divide the channels to be tested, randomly give K cluster centers, divide the channel gain values ​​to be classified into each cluster according to the nearest neighbor principle, and obtain the cluster center channel; Step 3: Calibrate each For the center channel of the channel cluster, the initial debugging value of the remaining channels in other channel clusters is obtained by calculating the difference with the center channel of the channel cluster where it is located, and the calibration is completed. The invention greatly improves the pass rate of one calibration and reduces the number of debugging, thereby greatly shortening the testing time and improving the production efficiency.

Description

technical field [0001] The invention relates to the field of wireless testing, in particular to a K-means algorithm-based calibration method for wireless testing. Background technique [0002] In the Internet era, wireless networks play an increasingly important role in people's lives. Therefore, more and more products are equipped with wireless functions. In order to ensure the normal use of wireless functions, in the production process, it is necessary to To calibrate and test wireless chips, efficient calibration algorithms are needed to meet the needs of mass production. [0003] In the production process, each circuit board is often wirelessly calibrated according to different hardware designs, or even different circuit boards of the same hardware design, and the calibration parameters that need to be written are often different. However, due to the large number of channels and test items that need to be calibrated, it often takes a long time and requires high retestin...

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Problems solved by technology

[0004] The purpose of the present invention is to provide a wireless test calibration method based on the K-means algorithm, which solves the problem that in the prior art, there are many channels and test items that need to be calibrated for the wireless network status test, resulting in low accuracy and low error rate. high problem

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