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A Low-Temperature Amplifier Power Stability Test System

A low-temperature amplifier and power stability technology, applied in receiver monitoring and other directions, can solve problems affecting measurement efficiency and reliability of measurement results, misrecording, misoperation, etc., and achieve high test efficiency, low cost, and strong practicability Effect

Active Publication Date: 2020-06-26
CHINA ELECTRONICS TECH GROUP CORP NO 16 INST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

At present, the power stability test of cryogenic amplifiers usually uses manual testing, which requires long-term measurement and manual data recording. When the amount of data is large and the measurement accuracy is high, problems such as misoperation and misrecording are prone to occur, affecting measurement efficiency and Reliability of measurement results

Method used

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  • A Low-Temperature Amplifier Power Stability Test System
  • A Low-Temperature Amplifier Power Stability Test System
  • A Low-Temperature Amplifier Power Stability Test System

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Embodiment Construction

[0023] The present invention will be further described below in conjunction with accompanying drawing:

[0024] Such as figure 1 A low-temperature amplifier power stability test system shown includes a space signal receiving module 1 , a low-temperature amplifier 2 , a DC power supply module 3 , an output signal detection module 5 , a signal generator 4 and a main control module 6 . The output terminal of the spatial signal receiving module 1 is connected to the input terminal of the cryogenic amplifier 2, and the spatial signal receiving module 1 is used for receiving spatial signals. The DC power supply module 3 is used for powering the cryogenic amplifier 2 . The output terminal of the signal generator 4 is connected to the input terminal of the output signal detection module 5 , and the signal generator 4 is used for calibrating the output signal detection module 5 . The output signal detection module 5 is interactively connected with the main control module 6, and the o...

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Abstract

The invention relates to a low-temperature amplifier power stability test system and a low-temperature amplifier power stability test method. The test system comprises a spatial signal receiving module, a power-temperature amplifier, a direct current power module, an output signal detection module, a signal generator and a main control module. The output end of the spatial signal receiving module is connected with the input end of the low-temperature amplifier. The signal generator and the output signal detection module are interactively connected. The output signal detection module and the main control module are interactively connected. The test system and the test method provided by the invention achieve an automatic test on power stability of the low-temperature amplifier, have the characteristics of high test efficiency and low cost, and also achieve unattended operation. The test system and the test method provided by the invention can automatically calibrate and compensate a dynamometer and the signal generator without manual operation, can automatically process test data, and has relatively strong practicability.

Description

technical field [0001] The invention relates to the technical field of low-temperature amplifier testing, in particular to a low-temperature amplifier power stability testing system and a testing method thereof. Background technique [0002] The cryogenic amplifier is one of the core components of the cryogenic receiver, which determines the success or failure of the entire receiving system. Since cryogenic receivers are mainly used in astronomical observations and military reconnaissance radars that require extremely high sensitivity, the stability of the cryogenic amplifier is related to the overall performance of the cryogenic receiver. At present, the power stability test of cryogenic amplifiers usually uses manual testing, which requires long-term measurement and manual data recording. When the amount of data is large and the measurement accuracy is high, problems such as misoperation and misrecording are prone to occur, affecting measurement efficiency and Reliability...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04B17/29H04B17/21
CPCH04B17/21H04B17/29
Inventor 孙婷婷刘文其何川肖南郑婷徐虎葛玲
Owner CHINA ELECTRONICS TECH GROUP CORP NO 16 INST