Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Textile defect detection method based on hierarchical clustering and Gabor filtering

A technology of hierarchical clustering and defect detection, which can be used in optical testing of defects/defects, measuring devices, material analysis by optical means, etc., and can solve the problem of low degree of automation.

Active Publication Date: 2017-05-31
CHANGZHOU UNIV
View PDF3 Cites 16 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The technical problem to be solved by the present invention is: in order to overcome the deficiency that the existing automatic detection method of textile defects is still based on manual selection or manual definition, and the degree of automation is not high, the present invention provides a textile defect detection method based on hierarchical clustering and Gabor filtering , by combining based on hierarchical clustering (hierarchical clustering, HC) algorithm and Gabor filter group analysis based on the digital image pixel gray information of the flat textile surface under the illumination source, the textile surface defect is automatically located, and the present invention is particularly suitable for automatic identification in stable Textile surface imperfections in digital images of flat textile surfaces captured under illumination sources

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Textile defect detection method based on hierarchical clustering and Gabor filtering
  • Textile defect detection method based on hierarchical clustering and Gabor filtering
  • Textile defect detection method based on hierarchical clustering and Gabor filtering

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0046] The present invention is described in further detail now in conjunction with accompanying drawing.

[0047] In order to make the statement clear, some symbols and concepts involved in the present invention are now focused on defining.

[0048] 1. Represents a set of positive integers.

[0049] 2. Represents the set of integers including zero.

[0050] 3. Represents the set of positive real numbers including zero.

[0051] 4. Represents the set of real numbers including zero.

[0052] 5. T represents matrix or vector transpose.

[0053] 6. Express ratio small largest integer, such as

[0054] 7. Indicates that the sequence of operands is concatenated to produce a vector, such as a scalar v 1 = 1 and the vector for scalar s 1 =8,s 2 = 1, s 3 = 5, for vector

[0055] 8. in

[0056] 9. Cb(v 1 , v 2 ) represents a vector v with the same dimension 1 with v 2 The Chebychev distance (Chebychev distance).

[0057] 10.{a i} represents t...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a textile defect detection method based on hierarchical clustering and Gabor filtering. A hierarchical clustering algorithm is combined with a Gabor filter set; digital image pixel gray-level information of a flat textile surface based on an illumination light source is analyzed to automatically position surface defects of a textile; the textile defect detection method comprises the main three steps of dividing a grid pattern, extracting characteristics and comparing the characteristics. The textile defect detection method provided by the invention is especially suitable for automatic recognition of textile surface defects in digital images, acquired under the stable illumination light source, on the flat surface of the textile; the textile defect detection method is a method for automatically dividing the grid pattern from the textile image based on the hierarchical clustering algorithm and carrying out characteristic extraction and defect recognition on the grid pattern based on the Gabor filter set.

Description

technical field [0001] The invention relates to a textile defect detection method based on hierarchical clustering and Gabor filtering. Background technique [0002] The accuracy rate of traditional manual recognition of textile defects is only 60-75% (K. Srinivasan, P.H. Dastoor, P. Radhakrishnaiah, et al.. FDAS: a knowledge-based framework for analysis of defects in woven textiles structures, J. Text. Inst. 83(1992) 431–448.), the method of machine automatic identification of textile defects has practical application requirements. Digital image samples of flat textile surfaces (hereinafter referred to as textile images) belong to two-dimensional textures, which have been shown to be generated according to pattern arrangements defined by 17 wallpaper groups (K. Srinivasan, P.H. Dastoor, P. Radhakrishnaiah, et al..FDAS: knowledge-based framework for analysis of defects in woven textile structures, J.Text.Inst.83(1992) 431–448.), the pattern used to generate two-dimensional ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88
CPCG01N21/8851G01N2021/8887Y02P90/30
Inventor 贾靓颜榴红
Owner CHANGZHOU UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products