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Phase unwrapping method and system

A phase unwrapping and phase technology, applied in the direction of image data processing, measuring devices, instruments, etc., can solve the problems of error propagation accumulation, time-consuming, time-consuming, etc., and achieve the effect of fast unfolding speed

Active Publication Date: 2017-06-06
SICHUAN UNIV
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AI Technical Summary

Problems solved by technology

[0003] The traditional spatial phase unwrapping method is to search and locate the truncation point point by point according to a certain path in the two-dimensional space of the truncated phase for phase unwrapping, which is time-consuming, and some algorithms will cause "drawing"-like error propagation and accumulation on the unwrapped path; the time phase The unfolding method can avoid this type of error, but it needs to project and acquire multiple images with different fringe periods or mark the order of each fringe period, and use the relationship between periods or the encoding order to perform phase unwrapping on the time axis. The class method brings time consumption and complexity to both measurement and reconstruction

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Embodiment Construction

[0034] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. The components of the embodiments of the present invention generally described and illustrated in the drawings herein may be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely represents selected embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative work shall fall within the protection scope of the present invention.

[0035] It...

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Abstract

The embodiment of the invention provides a phase unwrapping method and system. The method includes the following steps: obtaining a truncation phase of a measured object according to structured light projected to the surface of the measured object; obtaining a reference plane through shooting and obtaining a reference plane unwrapping phase, and performing unwrapping operation according to the truncation phase and the reference plane unwrapping phase, thereby obtaining a first phase distribution result; building a virtual plane continuous phase, and performing unwrapping operation on the truncation phase and the virtual plane continuous phase, thereby obtaining a second phase distribution result; and performing phase region fusion on the first phase distribution result and the second phase distribution result, thereby obtaining an unwrapping phase of the measured object and a height distribution result. According to the phase unwrapping method provided by the invention, the virtual plane continuous phase is added to assist phase unwrapping, after multiple times of stage-by-stage phase unwrapping is performed, combined with a plurality of unwrapped phases, a final correct unwrapped phase is obtained, the unwrapping speed is fast and error propagation and diffusion are not easy to occur.

Description

Technical field [0001] The invention relates to the field of computer measurement and calculation, and in particular to a phase unwrapping method and system. Background technique [0002] In recent years, with the rapid development of computer technology, optics and optoelectronics technology, three-dimensional surface measurement of objects has important significance. Optical three-dimensional surface shape measurement methods based on phase analysis have been deeply studied and widely used because of their non-contact, fast measurement speed, and high accuracy. This type of method modulates the height distribution of the measured surface shape into the phase change of the projection light field, analyzes the obtained deformed fringe pattern, and calculates the corresponding phase distribution to reconstruct the three-dimensional surface shape distribution of the measured object. Since the phase distribution is obtained by the arctangent function operation, the calculated phase...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/25G06T7/521
CPCG01B11/2527
Inventor 张启灿李凤娇刘守起
Owner SICHUAN UNIV
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