Detection method for crystalline silicon solar cell luminous decay resistance

Abstract

The invention discloses a detection method for crystalline silicon solar cell luminous decay resistance. The detection method comprises the following steps that 1) primary measurement of the conversion efficiency is performed on a crystalline silicon solar cell; 2) current is injected into the crystalline silicon solar cell through the mode of electric injection under the certain temperature condition; 3) secondary measurement of the conversion efficiency is performed on the crystalline silicon solar cell after electric injection; 4) the actual luminous decay rate of the crystalline silicon solar cell is calculated; and 5) the actual luminous decay rate is compared with the preset luminous decay rate of the accepted product, and if the actual luminous decay rate is not greater than the luminous decay rate of the accepted product, the crystalline silicon solar cell is judged to be the accepted product having the qualified luminous decay resistance; and if the actual luminous decay rate is greater than the luminous decay rate of the accepted product, the crystalline silicon solar cell is judged to be the defective product having the unqualified luminous decay resistance. Luminous decay testing can be rapidly performed on the crystalline silicon solar cell under the condition of low energy consumption so that the objective of monitoring the production technology in real time can be achieved.

Description

technical field [0001] The invention relates to a detection method for the anti-light attenuation ability of crystalline silicon solar cells. Background technique [0002] With the development of photovoltaic technology, the conversion efficiency of polysilicon solar cells is getting higher and higher, and the impact of light-induced attenuation (referred to as light attenuation) on solar cells is also increasing. The terminal market has strict requirements on the light attenuation rate of polysilicon solar cells. Therefore, in the production process of polycrystalline silicon solar cells, it is necessary to carry out real-time testing on the anti-light decay ability of finished crystalline silicon solar cells in order to achieve the purpose of monitoring the production process. At present, the conventional light attenuation test method is light, and the test time is long (generally greater than 6h), and the energy consumption is relatively large (generally greater than 100W...

AI Technical Summary

Problems solved by technology

At present, the conventional light attenuation test method is light, the test time is long (generally greater than 6h), and the energy consumption is large (generally greater than 100W / piece), which is not conducive to the production process monitoring of solar cells