Method and device for accelerated degradation of radar circuit board by electrical stress

Abstract

The invention relates to the field of reliability accelerating tests, and discloses a radar circuit board electrical stress deterioration accelerating method and apparatus. The method includes the following steps: acquiring the highest voltage stress level of a radar circuit board; on the basis of the highest voltage stress level of the radar circuit board and an acceleration velocity, determining a test plan; on the basis of acceleration test sample number selecting rules, determining the number of test samples; and on the basis of a test method, a test device and the number of test samples, designing a test system, and conducting a radar circuit board electrical stress deterioration accelerating test through the test system. The method can fully and effectively reflect the reliability of electronic products by selecting the radar circuit board to conduct electrical stress deterioration accelerating tests.

Description

technical field [0001] The invention relates to the technical field of reliability accelerated testing, in particular to a method and device for accelerated degradation of electrical stress of a radar circuit board. Background technique [0002] At present, with the increasing complexity of electronic equipment, higher requirements are put forward for the environmental adaptability and reliability of equipment in the modern battlefield environment. Because of the lack of effective field use data and life data of equipment, it is difficult to ensure the reliability of equipment. Accurate assessment of reliability poses challenges to preventive maintenance and support of equipment. Obtaining failure data and degradation data of equipment through environmental stress acceleration tests, combined with field data, and expanding the amount of data can effectively improve reliability assessment. the accuracy. Therefore, carrying out effective accelerated performance degradation te...

AI Technical Summary

Problems solved by technology

[0003] The failure of current electronic equipment is caused by environmental effects to a certain extent. The main environmental factors that cause the failure of electronic equipment are: temperature, humidity, dust, salt spray, strong electromagnetic pulse electrostatic discharge, etc. In addition, the instability of working stress is also Another main cause of product failure is that electronic equipment is mainly affected by factors such as power on and off, voltage, current, power, etc., which can easily cause performance damage to electronic components.

However, the electronic components targeted by the traditional electronic component-level electrical stress test cannot completely and accurately reflect the reliability of electronic products.

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