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Method and system for reducing noise in an image sensor using a parallel multi-ramps merged comparator analog-to-digital converter

A technology of image sensor and comparator, applied in the field of image sensor

Active Publication Date: 2017-07-21
OMNIVISION TECH INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, current image sensors require time, power, and die area to effectively perform multi-sampling in ramp-wave ADCs

Method used

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  • Method and system for reducing noise in an image sensor using a parallel multi-ramps merged comparator analog-to-digital converter
  • Method and system for reducing noise in an image sensor using a parallel multi-ramps merged comparator analog-to-digital converter
  • Method and system for reducing noise in an image sensor using a parallel multi-ramps merged comparator analog-to-digital converter

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Embodiment Construction

[0018] In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. However, it is understood that embodiments of the invention may be practiced without these specific details. In other instances, well-known circuits, structures and techniques have not been shown in order to avoid obscuring the understanding of this description.

[0019] Reference throughout this specification to "one embodiment" or "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment is included in at least one embodiment of the present invention. Thus, appearances of the phrases "in one embodiment" or "in an embodiment" in various places throughout this specification are not necessarily all referring to the same embodiment. Furthermore, the particular features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. Th...

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Abstract

The application relates to a method and a system for reducing noise in an image sensor using a parallel multi-ramps merged comparator analog-to-digital converter. A method of reducing noise in an image sensor using a parallel multi-ramps merged comparator analog-to-digital converter (ADC) starts with a pixel array capturing image data. The pixel array includes pixels to generate pixel data signals, respectively. An ADC circuitry acquires the pixel data signals. The ADC circuitry includes ADC circuits. Each of the ADC circuits includes a comparator and latches. The comparator includes a multi-input first stage. The comparator in each ADC circuit compares one of the pixel data signals to ramp signals received from a logic circuitry to generate comparator output signals. The latches in each ADC circuit latches the counter based on the comparator output signals, respectively, to generate ADC outputs. Other embodiments are described.

Description

[0001] cross-referenced applications [0002] This application is a continuation-in-part of US Patent Application Serial No. 14 / 985,092, filed December 30, 2015, which is hereby incorporated by reference in its entirety. technical field [0003] Examples of the invention relate generally to image sensors. More specifically, examples of the invention relate to methods and systems for reducing noise in image sensors using parallel multi-ramp combining comparator analog-to-digital converters (ADCs). Background technique [0004] High-speed image sensors have been widely used in many applications in different fields, including the automotive field, the field of machine vision, and the field of professional video photography. The technology for fabricating image sensors, and complementary metal-oxide-semiconductor (CMOS) image sensors in particular, has continued to evolve rapidly. For example, demands for higher frame rates and lower power consumption have driven further mini...

Claims

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Application Information

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IPC IPC(8): H04N5/3745H04N5/378
CPCH04N25/78H04N25/75
Inventor 奥利维尔·布尔特尔
Owner OMNIVISION TECH INC