Line order testing method, device and electronic equipment
一种测试方法、电子设备的技术，应用在存储领域，能够解决很难获取引脚连接关系、连接关系不是统一固定、引脚连接关系不相同等问题
Active Publication Date: 2017-08-08
MEDIATEK SINGAPORE PTE LTD SINGAPORE
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Problems solved by technology
[0003] However, the connection relationship between the pins of the memory and the pins of the electronic device is not uniform and fixed. The pin connection relationship of the
[0004] However, the inventors of the present application have found in practice that when performing work on the memory such as debugging (debug), the pin connection relationship between the memory and the electronic device needs to be used. , the attached hardware diagram between the memory and the electronic device can determine the above-mentioned pin connection relationship
However, if the hardware map is lost or wrong, it is difficult to obtain the above pin connection relationship
Method used
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[0024] In the following description, for purposes of illustration rather than limitation, specific details, such as specific system architectures, interfaces, and techniques, are set forth in order to provide a thorough understanding of the present application. It will be apparent, however, to one skilled in the art that the present application may be practiced in other embodiments without these specific details. In other instances, detailed descriptions of well-known devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.
[0025] see figure 1 , figure 1 It is a schematic diagram of the pin connection relationship between the memory and the electronic device in an application scenario of the line sequence testing method of the present invention. In this embodiment, the memory 11 includes multiple pins, such as pins DQ0-DQ15, and the electronic device 12 also includes multiple pins, such as pins DQ0-...
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The present invention discloses a line order testing method, device and electronic equipment. The method is used for testing pin connection relationship between a memory and the electronic equipment, and the method is as follows: using at least one test pattern for testing the memory to obtain at least one first data; according to the mapping relationship between the test pattern and the pin of the memory, estimating at least one second data obtained when the at least one test pattern is used for testing the memory; and according to the at least one first data and the at least one second data, determining the pin connection relationship between the memory and the electronic equipment. By the method, the pin connection relationship between the memory and the electronic equipment can be quickly and accurately tested.
Description
technical field [0001] The invention relates to the technical field of storage, in particular to a line sequence testing method, device and electronic equipment. Background technique [0002] As a device for storing data, memory is often used to store data in electronic devices. Specifically, multiple pins of the memory can be correspondingly connected to multiple pins of the electronic device, so as to realize data interaction. [0003] However, the connection relationship between the pins of the memory and the pins of the electronic device is not uniform and fixed. The pin connections may be different. [0004] However, the inventors of the present application have found in practice that when performing work on the memory such as debugging (debug), the pin connection relationship between the memory and the electronic device needs to be used. , the attached hardware diagram between the memory and the electronic device can determine the above-mentioned pin connection rela...
Claims
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IPC IPC(8): G11C29/36
CPCG11C29/36G11C2029/3602G11C29/022G11C29/10G11C29/1201G11C29/12015G11C29/56004G11C29/56012G11C2029/5602G11C29/38G01R31/31912
Inventor 于春雪
Owner MEDIATEK SINGAPORE PTE LTD SINGAPORE