Dual loop type temperature control module and electronic device testing apparatus provided with the same

Abstract

The invention relates to a dual loop type temperature control module and an electronic device testing apparatus provided with the same. The temperature control module comprises a first loop through which a first working fluid of a first temperature flows, a second loop through which a second working fluid of a second temperature flows, a controller for controlling a first switching valve such that the first or second working fluid flows through a temperature regulating device, and a second switching valve such that the working fluid flowing through the temperature regulating device returns to the first or second loop. The temperature regulating device adjusts a thermoelectric cooling device to reach two different reference temperatures based on the rise / fall of its temperature dependent on the working fluid. The thermoelectric cooling device regulates the temperature of the tested object under a wide range of temperature difference and with accuracy based on the reference temperatures to facilitate the detection of high / low temperature.

Description

technical field [0001] The invention relates to a dual-loop temperature control module and electronic component testing equipment equipped with the module, in particular to a temperature control module and electronic component testing equipment that can provide rapid and large switching between high and low temperature detection temperatures. Background technique [0002] As far as the current existing technology is concerned, it is quite rare to provide electronic component testing equipment with a wider temperature detection range, for example, it can handle low temperature detection and high temperature testing at the same time. [0003] U.S. Patent Application Publication No. 2015 / 0007973A1 discloses a "WIDERANGE OF TEMPERATURE CONTROL EQUIPMENT" (WIDERANGE OF TEMPERATURE CONTROL EQUIPMENT), which discloses a thermoelectric cooling module to provide temperature modulation, and a heat conduction plate to provide the thermoelectric The reference temperature of the cold mod...

AI Technical Summary

Problems solved by technology

However, the entire process of switching between high and low temperatures is quite slow, and if each component under test is set to perform high and low temperature tests on the same machine, the heating and cooling of the heat conduction plate will be repeated continuously, which will not only delay the entire test time schedule, and its heating unit and cooling equipment will also consume a lot of energy

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