Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

ate voltage test system and ate voltage test method

A technology of voltage testing and voltage value, which is applied in the field of display device testing, can solve the problems of IC scrapping, high defective rate, error, etc., achieve good display effect, improve yield rate, and reduce scrapping rate

Active Publication Date: 2019-09-17
TCL CHINA STAR OPTOELECTRONICS TECH CO LTD
View PDF9 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In fact, the voltage output of the PWM IC and P-Gamma IC in the PCBA has certain errors, and even the error range may exceed the range of the target voltage, so in many cases, various voltages out of range will appear in the ATE test of the PCBA. The problem is that the defect rate will be very high, resulting in the scrapping of the PCBA or the corresponding IC. The solution is to re-take the PCBA or IC for repair, change the IC, etc., which is time-consuming and laborious, and increases the cost.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • ate voltage test system and ate voltage test method
  • ate voltage test system and ate voltage test method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0024] In order to further illustrate the technical means adopted by the present invention and its effects, the following describes in detail in conjunction with preferred embodiments of the present invention and accompanying drawings.

[0025] see figure 1 , the present invention provides an ATE voltage testing system, comprising: a test fixture board 1, an output board 2 electrically connected to the test fixture board 1, and electrically connected to the test fixture board 1 and the output board 2 respectively. The computer 3 that is sexually connected; the PCBA to be tested is placed on the test fixture board 1. in:

[0026] The test fixture board 1 is provided with an I2C connection (not shown), for communicating with the PCBA to be tested;

[0027] The computer 3 is used to measure the output voltage value of the output board 2, and compare the output voltage value of the output board 2 with a preset qualified voltage value range to obtain a test result; The above tes...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides an ATE voltage testing system and an ATE voltage testing method. The system measures an output voltage of an output board (2) through a computer (3), compares the output voltage of the output board (2) with a preset qualified voltage range, and obtains a testing result. When the testing result is that the measured output voltage of the output board (2) is not within the qualified voltage range, a control signal is transmitted to a testing tool plate (1). The testing tool plate (1) adjusts the output voltage of a to-be-tested PCBA according to the control signal according to a I2C connection line, and transmits the adjusted output voltage of the PCBA to the output board (2), thereby adjusting the output voltage of the output board (2) in the preset qualified voltage range. The system can effectively improve the ATE voltage testing qualified rate, improves the yield of PCBAs, reduces the rejection rate, also can be used for managing and controlling a more precise gamma voltage value, and guarantees that the PCBA obtains a better display effect through cooperating with a panel in the subsequent process.

Description

technical field [0001] The invention relates to the field of display device testing, in particular to an ATE voltage testing system and an ATE voltage testing method. Background technique [0002] In the field of display technology, flat panel display devices such as Liquid Crystal Display (LCD) and Organic Light Emitting Diode (OLED) have gradually replaced Cathode Ray Tube (CRT) displays. [0003] Most of the liquid crystal displays currently on the market are backlight liquid crystal displays, which include a liquid crystal display panel and a backlight module. The liquid crystal display panel includes a thin film transistor array substrate (ThinFilm Transistor Array Substrate, TFT Array Substrate) and a color filter substrate (ColorFilter, CF) disposed opposite to each other and a liquid crystal layer filled between them. The liquid crystal display includes a plurality of pixels arranged in an array, each pixel is electrically connected to a thin film transistor (TFT), ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28
Inventor 张先明
Owner TCL CHINA STAR OPTOELECTRONICS TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products