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Wave length measurement method based on spatial adjacent wave height data dependency

A technology of data correlation and spatial adjacency, which is applied in measuring devices, measuring the movement of open-air water sources, surveying, mapping and navigation, etc., can solve the problems of low measurement accuracy and resolution, improve resolution and improve measurement accuracy , the effect of reducing the amount of data calculation

Active Publication Date: 2017-08-29
OCEAN UNIV OF CHINA
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Problems solved by technology

[0007] In order to solve the technical problem of low measurement accuracy or low resolution in the existing method of measuring ocean wave wavelength by a wave height meter, the present invention proposes a method for measuring ocean wave wavelength based on spatially adjacent wave height data correlation, which can solve the above problems

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  • Wave length measurement method based on spatial adjacent wave height data dependency
  • Wave length measurement method based on spatial adjacent wave height data dependency

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Embodiment 1

[0036] Embodiment 1, this embodiment proposes a method for measuring ocean wave wavelength based on spatially adjacent wave height data correlation, such as figure 1 shown, including the following steps:

[0037] S1. Set up two spatially adjacent wave height acquisition devices to collect two sets of wave height time series data at the same time. If the two wave height meters are not started at the same time, record the time difference Δt between the two wave height acquisition devices. 1 , the two sets of wave height time series data are preprocessed respectively, and the sampling period of the two wave height acquisition devices is t1;

[0038] In the actual measurement process, the detection buoy is generally put into the ocean. The buoy is equipped with a wave height acquisition device to measure the wave height. In order to ensure that the distance between the two wave height acquisition devices is constant, the same buoy can be equipped with two Or the above wave height...

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Abstract

The invention discloses a wave length measurement method based on spatial adjacent wave height data dependency. The method comprises the following steps: (1), collecting and preprocessing two groups of wave height time series data; (2), performing Fourier transformation on the wave height time series data, so as to obtain a prime analysis formula; (3), selecting the first m sinusoidal functions with the ratio of the sum of energy to total energy being greater than M, so as to obtain a new analysis formula; (4), performing interpolation on the new analysis formula in a time domain, so as to obtain fitting wave height data;(5), finding out delay time delta t when the relevancy of the two groups of fitting wave height data are the maximum; and (6), computing the wave lengths of waves which sequentially pass two spatial adjacent wave length connecting devices. The method improves the measurement accuracy by shortening the distance between two wave height gauges, and moreover reduces the data calculated amount and can further improve the resolution ratio of a sampling interval by only keeping wave frequencies with the sum of energy being a certain proportion to the total energy and performing interpolation.

Description

technical field [0001] The invention relates to the technical field of ocean wave wavelength measurement, in particular to a wavelength measurement method based on spatially adjacent wave height data correlation. Background technique [0002] The most common and most closely related to human activities construction has a very important guiding role. At the same time, the study of ocean waves is also of great significance to the global ocean-air interaction and climate change. The main elements of ocean waves include effective wave height, wavelength, wave period, etc. Among them, the effective wave height and wave period can be obtained by measuring the wave height meter (Wen Shengchang, 1984), which is relatively simple, while the measurement of wavelength is more complicated, which has become a problem for many The focus of scholars' research, this work has become an extremely critical technology in marine scientific research. [0003] At present, the commonly used wavel...

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Application Information

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IPC IPC(8): G01C13/00
CPCG01C13/00G01C13/006
Inventor 魏来管长龙
Owner OCEAN UNIV OF CHINA
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