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Research and test system and method of microwave dielectric characteristics of material in strong electromagnetic field environment

A microwave dielectric and testing system technology, applied in the direction of measuring resistance/reactance/impedance, measuring devices, measuring electrical variables, etc., can solve problems such as high cost and long research cycle, so as to improve reliability, reduce cost, and realize The effect of small sample multi-frequency point rapid test research

Inactive Publication Date: 2017-09-26
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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Problems solved by technology

This method of researching the electromagnetic properties of materials in a high-power environment is extremely expensive, and the research period is long

Method used

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  • Research and test system and method of microwave dielectric characteristics of material in strong electromagnetic field environment

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Embodiment Construction

[0019] Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.

[0020] As shown in the figure, a research and testing system for microwave dielectric properties of materials in a strong electromagnetic field environment includes three parts:

[0021] Compression resonator excitation part A: including signal source 2, which is used to provide excitation signals of different power levels and change the electromagnetic field strength in the resonator;

[0022] Resonant system part B: including compre...

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Abstract

The invention provides a research and test system and method of microwave dielectric characteristics of a material in a strong electromagnetic field environment. The system comprises three parts, a compression type resonant cavity excitation part A, a resonance system part B and a microwave resonance parameter extraction part C, wherein the compression type resonant cavity excitation part A comprises a signal source; the resonance system part B comprises a compression type resonance cavity, an SMA adapter, an electric probe and a coupling ring; the microwave resonance parameter extraction part C comprises a band stop filter and a vector network analyzer; the compression type resonance cavity can realize simulation of high-power environment experiments with a low-power source, and the cost of the experiment research through direct use of the high-power source is greatly reduced; introduction of the band stop filter enables an excitation power signal and a test power signal to be separated, accordingly, the research error of an experiment test can be deducted, and the reliability of test and research results is improved. The system can realize rapid test and research of a small sample at multi-frequency points, and the research and development cycle of a microwave material applied to a high-power microwave system is shortened.

Description

technical field [0001] The invention belongs to the application field of microwave measurement, in particular to a research and testing system and method for microwave dielectric properties of materials in a strong electromagnetic field environment. Background technique [0002] Microwave materials are the carrier of the application and development of microwave technology. The electromagnetic parameters of microwave materials completely determine the propagation characteristics of electromagnetic waves in it. Therefore, accurate acquisition of electromagnetic parameters of microwave materials is an important basis for the development of microwave technology. [0003] Usually, the research on the electromagnetic parameters of microwave materials is mostly limited to the case of small signals, that is, the parameters of microwave dielectric and loss characteristics of microwave materials at a certain operating frequency are directly measured by using vector network analyzers....

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Application Information

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IPC IPC(8): G01R27/26
CPCG01R27/2623
Inventor 高勇李恩郭高凤张云鹏余承勇高冲李亚峰
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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