3D projection scanning test device

Abstract

A 3D projection scanning test device disclosed by the present invention comprises a rack, a reference measurement platform, an X-axis mechanism, two parallel Y-axis mechanisms, a Z-axis mechanism and a 3D scanner. The reference measurement platform and the Y-axis mechanisms are both arranged on the rack, the X-axis mechanism is erected on the two parallel Y-axis mechanisms slidably, and the Z-axis mechanism is arranged on the X-axis mechanism slidably; the 3D scanner is arranged on the Z-axis mechanism and comprises a 3D scanning system, an industrial vision module and a lead screw, the lead screw is connected with the servo motor output end of the Z-axis mechanism, the 3D scanning system is connected with the lead screw, and the 3D scanning system and the industrial vision module correspond to the reference measurement platform. According to the present invention, a needed product is placed on the reference measurement platform, the device is started to enable the X-axis mechanism, the Y-axis mechanisms and the Z-axis mechanism to be in linkage, the 3D scanning system and the industrial vision module on the Z-axis mechanism measure the product, and the measured data is fed back to a control system and finally is exported.

Description

technical field [0001] The invention relates to the technical field of testing equipment, in particular to a 3D projection scanning testing equipment. Background technique [0002] The earliest appeared was the contact measurement method, represented by the three-dimensional coordinate measuring machine. Although the accuracy reached the micron level (0.5mm), its application field was limited due to the shortcomings of huge volume, high cost and inability to measure soft objects. [0003] So there are non-contact measurement methods, which are mainly divided into two categories: [0004] One is the passive method, which does not require a specific light source and relies entirely on the natural light conditions of the object for scanning. Binocular technology is often used, but the accuracy is low, and only objects with geometric features can be scanned, which cannot meet the requirements of many fields. ; [0005] The other is the active method, which is to project specif...

AI Technical Summary

Problems solved by technology

[0004] One is the passive method, which does not require a specific light source and relies entirely on the natural light conditions of the object for scanning. Binocular technology is often used, but the accuracy is low, and only objects with geometric features can be scanned, which cannot meet the requirements of many fields. ;

[0005] The other is the active method, which is to project specific light to the object, which represents the technology of laser line scanning, which has relatively high precision, but because only one light can be projected at a time, the scanning speed is slow

In addition, because the laser will cause damage to living organisms and more precious objects, it cannot be applied to certain specific fields.

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