Parallel test system and test method for near-field directional diagram of phased array antenna

A phased array antenna and test system technology, applied in the antenna radiation pattern and other directions, can solve the problems of heavy workload, heavy test tasks, and easy to cause misoperation, so as to reduce manual operation and improve test efficiency

Inactive Publication Date: 2017-10-17
LEIHUA ELECTRONICS TECH RES INST AVIATION IND OF CHINA
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Problems solved by technology

However, testing the radiation characteristics of phased array antennas is a complex technical topic, and usually requires a large number of tests for verification. Compared with ordinary antennas, the test complexity is much higher, and the test task is large.
[0004] However, the currently k

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  • Parallel test system and test method for near-field directional diagram of phased array antenna
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  • Parallel test system and test method for near-field directional diagram of phased array antenna

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[0043] In order to make the objectives, technical solutions, and advantages of the implementation of the present invention clearer, the technical solutions in the embodiments of the present invention will be described in more detail below in conjunction with the accompanying drawings in the embodiments of the present invention. In the drawings, the same or similar reference numerals indicate the same or similar elements or elements with the same or similar functions. The described embodiments are part of the embodiments of the present invention, rather than all of the embodiments. The embodiments described below with reference to the accompanying drawings are exemplary, and are intended to explain the present invention, but should not be construed as limiting the present invention. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present inv...

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Abstract

The invention relates to the field of microwave testing, particularly to a parallel test system and test method for a near-field directional diagram of a phased array antenna. The parallel test system is composed of an antenna mounting rotary table for fixing a to-be-tested antenna and driving the antenna to make deflection, a scanning frame being provided with a probe and being used for collecting near-field data of the to-be-tested antenna, a signal transceiver for transmitting a radio frequency signal to the to-be-tested antenna and receiving the near-field data, a wave control adapter for transmitting a wave control instruction to the to-be-tested antenna, and an industrial personal computer connected with the signal transceiver, the wave control adapter, the antenna mounting rotary table, the probe and the signal transceiver respectively. According to the parallel test system and test method, on the basis of near-field probe single scanning, a multi-beam, multi-frequency, full-automatic parallel testing of the phased array antenna is realized, so that the testing efficiency is improved and the manual operation is reduced.

Description

technical field [0001] The invention relates to the field of microwave testing, in particular to a parallel testing system and testing method for the near-field pattern of a phased array antenna. Background technique [0002] Phased array antennas have the characteristics of high tracking accuracy, fast scanning speed, light weight, small size, high reliability and maintainability, and strong anti-interference ability. They are widely used in early warning radar, navigation guidance and other equipment. [0003] At present, it is necessary to comprehensively test and optimize the directivity coefficient, beam width, sidelobe level, polarization mode, beamforming and other parameters of each wave position of the phased array antenna to ensure the final imaging quality. However, testing the radiation characteristics of phased array antennas is a complex technical topic, and usually requires a large number of tests for verification. Compared with ordinary antennas, the test com...

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Application Information

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IPC IPC(8): G01R29/10
CPCG01R29/10
Inventor 徐清于丽爽李为玉
Owner LEIHUA ELECTRONICS TECH RES INST AVIATION IND OF CHINA
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