AOI (Automated Optical Inspection)-based display panel defect classification method and device

A technology for display panel defects and classification methods, which is applied in the directions of measuring devices, optical testing flaws/defects, and analyzing materials, etc., can solve the problems of difficult control of gray uniformity, high false detection rate, and complicated manufacturing process, so as to improve the The effect of detection efficiency and accuracy

CN107290345AActive Publication Date: 2017-10-24WUHAN JINGCE ELECTRONICS GRP CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Current Assignee / Owner
Publication Date
2017-10-24

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Abstract

The invention discloses an AOI (Automated Optical Inspection)-based display panel defect classification method and device. The method comprises the following steps: 1) acquiring a display picture of a display panel, and extracting a defect feature attribute vector d of the display picture; and 2) providing a defect feature attribute descriptive set M, wherein the defect feature attribute descriptive set M comprises feature attribute description vectors m of multiple defect types; respectively performing convolution on the defect feature attribute vector d and the feature attribute description vector m of each defect type, and generating a group of convolution values, wherein the defect type corresponding to the maximum convolution value is the defect type of the defect feature attribute vector d. According to the method disclosed by the invention, the automation degree of defect recognition and grade determination of the display panel can be realized by automatically extracting the defect feature information of the display panel and automatically recognizing the quantities and types of the display defects, and the detection efficiency and accuracy of the defect recognition and grade determination of the display panel can be greatly improved.
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Description

Technical field

[0001] The present invention relates to the technical field of display panel inspection, in particular to an AOI-based display panel defect classification method and device. Background technique

[0002] Flat-panel displays have the advantages of high resolution, high grayscale, and no geometric distortion. At the same time, due to their small size, light weight and low power consumption, they are widely used in consumer electronics products that people use daily, such as televisions, computers, Mobile phones, tablets, etc. The display panel is the main component of the flat display device, and its manufacturing process is complicated. And as the size of the display panel becomes larger, the uniformity of the gray scale becomes more and more difficult to control. Therefore, it is inevitable that various problems will occur during the manufacturing process. A variety of display defects, such as bright spots / dark spots / bright foreign objects / BL foreign objects (bac...

Examples

Embodiment

[0033] Embodiment: A display panel defect level judging device capable of learning, classifying and judging the defect type of the display panel

[0034] Such as figure 1 As shown, a display panel defect level determination device provided by an embodiment of the present invention mainly includes an industrial camera, an image algorithm processing module, a defect classifier learning module, a defect classification module, and a defect level determination module. Among them, the industrial camera is mainly used to collect the display screen of the display panel; the image algorithm processing module is mainly used to extract defect feature information from the display screen; the defect classifier learning module is used to provide defect type configuration files and defect feature attribute gradient files; The defect classification module is used to identify the defect type according to the defect type configuration file and the defect feature attribute gradient file; the defect...