Capacitance measurement method and device
A measurement method and a technology of a measurement device, which are applied in the field of capacitance value measurement methods and devices, can solve the problems that the external compensation detection line cannot obtain accurate parasitic capacitance values of the external compensation detection line, etc.
Active Publication Date: 2019-12-24
BOE TECH GRP CO LTD +1
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Problems solved by technology
[0004] The object of the present invention is to provide a capacitance value measurement method and device to solve the problem that the existing capacitance value measurement method of the external compensation detection line cannot obtain accurate parasitic capacitance value of the external compensation detection line
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specific Embodiment approach
[0091] According to a specific implementation manner, the control to open all switching elements included in the nth switching unit except the Ath switching element, and the step of controlling to close the Ath switching element may include:
[0092] Controlling time-sharing to sequentially close a plurality of switching elements included in the n-th switching unit; when the A-th switching element is controlled to be closed, controlling to open all the switching elements included in the n-th switching unit except the A-th switching element switch element;
[0093] The standard temperature t0 of the analog-to-digital conversion unit is the temperature of the n-th analog-to-digital conversion unit detected when the first switch element included in the n-th switch unit is controlled to be closed.
[0094] In actual operation, a plurality of switching elements included in a switching unit may be closed sequentially, and the temperature of the analog-to-digital conversion unit when...
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The invention provides a capacitance value measuring method and device. The method for measuring the capacitance value includes: obtaining the first mapping relationship; setting the standard temperature t0 of the analog-to-digital conversion unit; controlling the opening of all switching elements included in the switching unit except the A-th switching element, controlling the closing of the A-th switching element, and detecting the analog-to-digital conversion unit. The real-time analog-to-digital conversion unit temperature t of the digital conversion unit detects the real-time capacitance value Cn of a test point, and according to the real-time capacitance value and the first mapping relationship, the real-time analog-to-digital conversion circuit temperature t and the first switching element are obtained. The parasitic capacitance value of the connected external compensation detection line; A is a positive integer. The invention can obtain accurate parasitic capacitance value of the external compensation detection line.
Description
technical field [0001] The invention relates to the technical field of capacitance value measurement, in particular to a capacitance value measurement method and device. Background technique [0002] OLED (Organic Light Emitting Diode) display panel has become a technology that various panel manufacturers are vying to develop due to its high contrast, low power consumption and self-illumination. Because of the instability of TFT (Thin Film Transistor) devices, existing pixel circuits need to consider the impact of TFT device performance changes, and often use a 3T1C compensation circuit structure. [0003] Such as figure 1 As shown, the 3T1C compensation circuit includes a switching thin film transistor T1, a driving thin film transistor T3, a detecting thin film transistor T2 and a storage capacitor Cst. exist figure 1 Among them, the one labeled OLED is an organic light-emitting diode, the one labeled DATA is a data line, the one labeled Gate is a gate line, the one lab...
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IPC IPC(8): G01R27/26
CPCG01R27/2605G09G3/3225G09G3/3233G09G2300/0819G09G2300/0842H03M1/12G09G2320/041H03M1/089G09G3/006
Inventor 冯雪欢李永谦
Owner BOE TECH GRP CO LTD