Microcircuit internal atmosphere detection test clamp

A technology of internal atmosphere and test fixture, which is applied in the direction of measuring device, analysis of gas mixture, gas analyzer structure details, etc., can solve the problems of large influence on test results, long time-consuming vacuuming, and inappropriate size, etc., to shorten the test cycle , reduce extra gas, speed up the effect of vacuuming

Active Publication Date: 2017-11-24
NO 24 RES INST OF CETC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At the same time, for the detection of the atmosphere inside the microcircuit, test furniture is bound to be needed. However, the existing problems or defects of the test fixture for the detection of the atmosphere inside the circuit are: 1. The size is not suitable; 2. The volume is large, and the vacuuming takes a long time; 3. Poor sealing; 4. The internal atmosphere of the fixture itself has a great influence on the test results

Method used

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  • Microcircuit internal atmosphere detection test clamp
  • Microcircuit internal atmosphere detection test clamp
  • Microcircuit internal atmosphere detection test clamp

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0028] The embodiment is basically as attached figure 1 , 3 , shown in 4: the present embodiment provides a kind of microcircuit internal atmosphere detection test fixture, and it is made up of mother clip body 1, sub-clip body 2, cover body 3, and the central part of one end of described mother clip body 1 is provided with concave The pressure cavity 1A is used to place the sub-clamp body 2, and the pressure cavity 1A is provided with a through connection channel 1B for accommodating the device to be tested (not shown), and the female clamp body 1 is connected to the pressure cavity 1A The outer edge of the same side of the mouth is provided with a relief part 1C for installing a sealing ring (not shown), and the cover body 3 covers the mouth of the pressure chamber 1A and covers the sealing ring; its female clip body 1 Both the clip body and the sub-clip body 2 adopt an optimal circular structure, of course, in different embodiments, a square or oval structure can also be u...

Embodiment 2

[0035] The difference between this embodiment and Embodiment 1 is that the pressure chamber 1A is two, one large and one small, distributed in a stepped shape, and the cross section of the larger pressure chamber 1A is D-shaped, with a sealing gasket ( not shown). In this way, the sub-fixture 2 also has the same D-shaped cross-section as the larger pressure chamber 1A cross-section, so that the sub-fixture 2 will not rotate in the pressure chamber 1A, and the bottom of the larger pressure chamber 1A is provided with a seal The pad can further seal the connection channel 1B of the female clip body 1, which is beneficial to the internal atmosphere detection test of the device to be tested.

Embodiment 3

[0037] The difference between this embodiment and the first and second embodiments is that the sub-clip body 2 is integrated on the cover body 3 to form an integrated structure; in this way, it is convenient for test operation and fixture arrangement. At the same time, the outer wall of the sub-clamp body 2 is provided with anti-skid lines, forming an interference fit with the pressure chamber 1A, which can further reduce the generation of extra gas inside the clamp.

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Abstract

The invention discloses a microcircuit internal atmosphere detection test clamp and relates to the field of reliability and environment tests of electronic products. The clamp comprises a primary clamp body, a secondary clamp body and a cover body, wherein an inwards concave press cavity is formed in the central position of one end of the primary clamp body and used for accommodating the secondary clamp body, a through connecting channel is formed in the press cavity and used for accommodating a to-be-tested device, a yield part is arranged on the peripheral edge, located on the same side of an opening part of the press cavity, of the primary clamp body and used for mounting a seal ring, and the cover body covers the opening of the press cavity and the seal ring. The clamp provides a new thought for accommodating of the to-be-tested device, that is, the connecting channel with the diameter slightly larger than that of the to-be-tested device is designed, the to-be-tested device is put in the connecting channel, the sealing property of the clamp and protection of the to-be-tested device are greatly improved, besides, the matched secondary clamp body is designed, can fix the to-be-tested device and can greatly reduce vacant space in the clamp, and influence of the atmosphere of the clamp on the detection result is further reduced.

Description

technical field [0001] The invention relates to the technical field of electronic product reliability and environmental testing, in particular to a test fixture for detecting the atmosphere inside a microcircuit. Background technique [0002] With the development of aerospace, aviation, and marine electronic technologies, higher requirements are put forward for the electronic components used. In addition to high quality and high reliability, they also require long service life. To a large extent, the service life of microelectronic devices is related to the content of the atmosphere inside the microcircuit. A small air leak will allow air to enter the device interior, causing severe bond wire corrosion and electrical failure. Therefore, the detection of the atmosphere inside the microcircuit is particularly important, that is: a large amount of information that can be used to improve product quality and reliability can be provided by the internal atmosphere test report of t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N33/00
CPCG01N33/0009
Inventor 谭骁洪罗俊邢宗锋杨迁李晓红邓永芳张丽巍李真张锋邱忠文吴兆希朱朝轩林震
Owner NO 24 RES INST OF CETC
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