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Microscopy system with auto-focus adjustment by low-coherence interferometry

A low-coherence interference, microscope system technology, applied in microscopes, interferometers, instruments, etc., can solve problems such as no discovery

Active Publication Date: 2017-11-28
THORLABS INC
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

No existing literature was found describing this automatic calibration

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  • Microscopy system with auto-focus adjustment by low-coherence interferometry
  • Microscopy system with auto-focus adjustment by low-coherence interferometry
  • Microscopy system with auto-focus adjustment by low-coherence interferometry

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Embodiment Construction

[0033]In accordance with the principles of the invention, the description of the illustrative embodiments is intended to be read in conjunction with the accompanying drawings, which are to be considered a part of the entire written description. In the description of the embodiments disclosed in the present invention, any reference to directions or orientations is only for convenience of description, and is not intended to limit the scope of the present invention in any way. Relative terms such as "lower", "higher", "horizontal", "vertical", "above", "below", "upper", "lower", "top" and "bottom" and derivatives thereof (eg, "horizontally," "downwardly," "upwardly," etc.), should be construed to refer to an orientation as described or as shown in the figure in question. These relative terms are used for convenience of description only and do not require that the device be constructed or operated in a particular orientation unless expressly indicated. Terms such as "attach", "ad...

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Abstract

Disclosed are several technical approaches of using low coherence interferometry techniques to create an autofocus apparatus for optical microscopy. These approaches allow automatic focusing on thin structures that are positioned closely to reflective surfaces and behind refractive material like a cover slip, and automated adjustment of focus position into the sample region without disturbance from reflection off adjacent surfaces. The measurement offset induced by refraction of material that covers the sample is compensated for. Proposed are techniques of an instrument that allows the automatic interchange of imaging objectives in a low coherence interferometry autofocus system, which is of major interest in combination with TDI (time delay integration) imaging, confocal and two-photon fluorescence microscopy.

Description

[0001] Cross References to Related Applications [0002] This application claims the benefit of US Provisional Patent Application No. 62 / 107,675, filed January 26, 2015, the contents of which are hereby incorporated by reference. technical field [0003] Generally, the present invention relates to the field of microscopy. More specifically, the present invention relates to microscope systems with automatic focus adjustment by low-coherence interferometry. Background technique [0004] For many confocal, two-photon and TDI scanning microscopes, very fast autofocus procedures are required. This rapid procedure requires the combination of large imaging objectives (numerical aperture >0.5) and the sample material (eg, sectioned tissue used in histology) located below a reflective surface. [0005] In the prior art, several autofocus methods are known. Most of these methods are based on special frequency analysis of images acquired from a sample by using an imaging camera. ...

Claims

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Application Information

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IPC IPC(8): G02B21/00G01B9/02G02B27/40
CPCG01B9/0209G02B7/28G02B21/0004G01B9/02059G01B9/02063G01B9/02077G01B9/0203G01B9/02091G01B2290/50G02B21/245G02B21/26
Inventor A·凯布尔J·伍伦兹R·约翰斯通K·戈西奇J·S·布鲁克J·米尔斯J·蒋D·希尔曼
Owner THORLABS INC
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