Method and device for screening machine learning features
A screening machine and machine learning technology, applied in the direction of instruments, computer components, character and pattern recognition, etc., can solve problems such as heavy workload, prolonged modeling cycle, and affecting model training effect
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[0145] like image 3 As shown, the embodiment of the present invention illustrates the steps of screening machine learning feature tasks:
[0146] The first step is to use the machine learning algorithm to screen the features, and filter out the features that are obviously irrelevant to the target variable.
[0147] In the second step, the remaining features are used for model training and their performance results are evaluated. Use the logistic regression algorithm to train the remaining features, calculate the indicators AUC and KS for evaluating the performance of the model, and record w1, w2, ... wn to represent the weight value of each feature in the model.
[0148] In the third step, each feature is removed for model training and evaluation. Remove each feature separately and retrain with the logistic regression model to obtain the evaluation index. The performance index of the model with the i-th feature removed is AUC respectively. i 、KS i .
[0149] The fourth s...
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