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Method of correcting tangent height value based on infrared occultation sensor

A star sensor and high-value technology, which is applied in the field of correcting the high-cut value based on the infrared occultation sensor, can solve the problem of inaccurate level-cut height and achieve the effect of simple and accurate correction method

Active Publication Date: 2018-01-05
INST OF REMOTE SENSING & DIGITAL EARTH CHINESE ACADEMY OF SCI
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Problems solved by technology

[0003] The purpose of the present invention is to solve the inaccurate inaccuracy of the first-level cut height in the prior art, and provide a simpler, faster and more accurate cut height correction method based on the characteristics of the occultation sensor

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  • Method of correcting tangent height value based on infrared occultation sensor
  • Method of correcting tangent height value based on infrared occultation sensor
  • Method of correcting tangent height value based on infrared occultation sensor

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Embodiment Construction

[0017] The technical solutions of the present invention will be described in further detail below with reference to the accompanying drawings and embodiments.

[0018] figure 1 A schematic diagram of a method for correcting the cut-off value based on the infrared occultation sensor provided by the embodiment of the present application, as shown in figure 1 As shown, step S101-step S103 are included.

[0019] In step S101, initial data is acquired by an infrared occultation sensor, and the initial data is processed to obtain primary data, where the primary data includes multiple primary cut heights and atmospheric components.

[0020] Step S102 , performing wavenumber processing on the primary data to remove abnormal cut height values ​​in the multiple primary cut heights; and performing sensitivity analysis on multiple gases in the atmospheric composition within the wavenumber range.

[0021] in such as figure 2 In the example shown, according to the HITRAN database, there...

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Abstract

The invention relates to a method of correcting a tangent height based on an infrared occultation sensor. The method comprises steps: first-level data are acquired through the infrared occultation sensor, wherein the first-level data comprise multiple tangent heights and an atmospheric composition; the first-level data are subjected to wave number processing to remove abnormal tangent heights in the multiple tangent heights; sensitivity analysis is carried out on multiple gases in the atmospheric composition in a wave number range; and through the sensitivity analysis, after gases which affectthe wave number in the atmospheric composition are eliminated on the basis of the wave number range, and logarithmic gradient trigonometry is adopted to correct the tangent heights in the first-leveldata. The quick tangent height correction method can perform tangent height correction based on the occultation sensor features more simply, quickly and accurately.

Description

technical field [0001] The invention relates to the field of height cut correction, in particular to a method for correcting cut height values ​​based on an infrared occultation sensor. Background technique [0002] The accuracy of cut height plays a crucial role in satellite occultation observation mode. TangentHeight is the altitude of a series of tangent lines between the light path and each layer of the atmosphere. In the process of inversion of gas composition in the atmosphere, the height of the cut height affects the accuracy of the inversion. Because infrared occultation observations are not accurate, they need to be corrected before the subsequent inversion. At present, the method of infrared occultation sensors such as ACE-FTS to cut height needs such as CO 2 Prior knowledge and other information, and the inversion rate is slow. The error sources of the cutting height of first-class products mainly include three parts: instrument system error, atmospheric refra...

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Application Information

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IPC IPC(8): G01D3/028G01N21/31
Inventor 李小英朱松岩邹铭敏王红梅王雅鹏苗晶
Owner INST OF REMOTE SENSING & DIGITAL EARTH CHINESE ACADEMY OF SCI
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