Method for communicating with object under test and system using the method

Abstract

The present invention provides a method for communicating with an object under test and a system for applying the method. The method of communicating with the object under test includes: providing a command signal to the object under test through the processing unit of the system, and waiting to receive a response signal output by the object under test after receiving the command signal, if the processing unit waits for a preset waiting time length When the response signal output by the object under test is not received, the command signal is provided to the object under test again, and the preset waiting time length is adjusted; wherein, the adjusted preset waiting time length is the same as that of providing the command signal to the object under test The number of times provided has an exponential relationship. The invention can reduce the probability of re-communication and communication failure rate, and shorten the communication time.

Description

technical field [0001] The invention relates to the field of communication, in particular to a method for communicating with an object under test and a system for applying the method. Background technique [0002] In today's electronic product manufacturing industry or the production line of electronic assembly plants, testing engineering plays an extremely important role, the purpose is to ensure that each product or any of the assembled components can have the due quality standards and reliability; Among them, different products or different assembly components have their own test procedures and test methods, and the test procedures and test methods will be written into a test program for test engineers or testers on the production line to test Work. [0003] see figure 1 , which is a schematic block diagram of a test system on an existing production line. The electronic computer 1 is electrically connected to the object under test 3, and the detection program 11 is set...

AI Technical Summary

Problems solved by technology

However, after the test program 11 outputs the command signal S1 to the test object 3, it does not receive the response signal S2 from the test object 3 within the preset waiting time length, which may be caused by the insufficient preset waiting time length, not The DUT 3 does not respond or does not meet the quality standards. Therefore, under this premise, if the preset waiting time does not change, each test will still produce a response signal from the DUT 3. The result of S2, resulting in the final judgment of detection failure

[0006] Based on the above description, the existing test system and its test method have the defects of high retest rate, high detection failure rate and long test time, so there is room for improvement

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