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Measuring method, measuring device and measuring system for nonlinear absorption rate of optical material

An optical material and measuring device technology, applied in the direction of measuring device, material analysis by optical means, analyzing materials, etc., can solve the problem of displacement, cannot guarantee that the spot is irradiated in the same area of ​​the sample, and cannot guarantee the accuracy of non-uniform sample measurement and other problems, to achieve the effect of low cost, good stability and simple structure

Inactive Publication Date: 2018-01-09
NAT UNIV OF DEFENSE TECH
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Problems solved by technology

[0004] The disadvantage of the known system is that the sample is displaced in the direction of beam propagation, and it cannot be guaranteed that the light spot is always irradiated on the same area of ​​the sample, so that the accuracy of the measurement of the non-uniform sample cannot be guaranteed
[0005] At present, there is a huge demand for related research on inhomogeneous materials. The traditional Z-scan technology cannot meet the technical requirements. It is of great significance to conduct technical research on nonlinear absorption coefficient measurement for the special requirements of inhomogeneous materials.

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  • Measuring method, measuring device and measuring system for nonlinear absorption rate of optical material

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Embodiment Construction

[0035] The present invention will be further described below in conjunction with the accompanying drawings and specific preferred embodiments, but the protection scope of the present invention is not limited thereby.

[0036] In the micro-area measurement method for nonlinear absorptivity of optical materials in this embodiment, a laser with varying light intensity is used to irradiate a fixed irradiation area of ​​the sample to be tested, and the first light intensity of the laser before irradiating the sample to be tested and the first light intensity of the laser after irradiating the sample to be tested are obtained. the second light intensity of the transmitted laser light, and calculate and determine the nonlinear absorption rate of the sample to be measured through the first light intensity and the second light intensity.

[0037] In this embodiment, the linear optical attenuation sheet that can move perpendicular to the optical path is irradiated with laser light, and t...

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Abstract

The invention discloses a measuring method, a measuring device and a measuring system for the nonlinear absorption rate of an optical material. The method comprises the following steps: irradiating afixed irradiation area of a to-be-measured sample by using laser with changeable light intensity to obtain first light intensity of laser before the to-be-measured sample is irradiated and second light intensity of transmission laser after the to-be-measured sample is irradiated; calculating by using the first light intensity and the second light intensity to determine the nonlinear absorption rate of the to-be-measured sample. According to the measuring method, the measuring device and the measuring system disclosed by the invention, the nonlinear absorption rate of a measuring area of the to-be-measured sample can be accurately measured, and the condition that the precision of the measurement result caused by reduction of the changed irradiation area of the laser in the measuring processis avoided; the measuring method, the measuring device and the measuring system have the advantages of high measuring precision, good stability, simple operation and the like.

Description

technical field [0001] The invention relates to the field of nonlinear absorption measurement of optical materials, in particular to a method and system for measuring the nonlinear absorption rate of optical materials in a micro-area, which is used in optical material parameter measurement, spectrum, phase shift dispersion measurement and material engineering. Materials, especially the study of nonlinear effects of nanomaterials. Background technique [0002] Optical materials with excellent nonlinear coefficients are widely used in the manufacture of light-emitting diodes (LEDs), lasers, solar cells and other devices. [0003] The nonlinear coefficients of optical materials are usually measured by the laser Z-scanning technique first proposed by Sheik Bahae et al. In the system, a focused, high-power laser beam is passed through a sample of material to be measured. The sample can move in the Z direction of light propagation, so that as the position of the sample changes, ...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/17
Inventor 江天郝昊张峻陈润泽郑鑫许中杰程湘爱沈超韦可李汉武庆雄刘煜阳东升赵杰周军虎杨澜王义之
Owner NAT UNIV OF DEFENSE TECH