A Measuring Device of High Speed ​​Impact Damage Time

Abstract

The invention discloses a high-speed impact damage time measuring device and method. The device comprises a fluorescent fiber sensor, a coupler, a photoelectric detector, a signal preprocessing and identifying module, a standard time acquisition module, a signal acquisition and processing module that are successively connected. The photoelectric detector is used for converting the optical signal output by the fluorescent fiber sensor and coupled by the coupler into an electrical signal; the signal preprocessing and identifying module is used for preprocessing and identifying the electrical signal and outputting the identification result; the signal acquisition and processing module is used for fusing the counter value and the standard time output by the standard time acquisition module according to the identification result, correcting the error, and calculating to obtain the high-speed impact damage time. The scheme can be applied to high-speed impact damage parameter measurement suchas weapon attack prevention and space debris measurement, and can meet the requirements of special working conditions of high-speed impact damage measurement.

Description

technical field [0001] The invention belongs to the technical field of high-speed impact damage measurement, and in particular relates to a measuring device and method for high-speed impact damage time. Background technique [0002] With the deepening of research in the fields of weapon attack and defense, space debris measurement, etc., more and more working conditions involving high-speed impact, it is of great significance to accurately measure the impact damage time, impact speed, damage location and other parameters during high-speed impact . [0003] During a high-speed impact, intense electromagnetic radiation, thermal effects, and severe deformation will be generated in a very short period of time. These characteristics bring many difficulties to the measurement of high-speed impact damage parameters. Electrical sensors are very easy to fail due to interference caused by electromagnetic radiation; ordinary sensors cannot adapt to the high-temperature and high-pressu...

AI Technical Summary

Problems solved by technology

The signals in these two methods are susceptible to electromagnetic interference, and the cables are prone to open or short circuits, causing the information link to fail or generate erroneous signals

Moreover, both of these two patents use electric sensors, which are very easy to fail under strong electromagnetic interference, and are only used on the ground, and have great limitations in the atmosphere and space.

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