Radio frequency tag testing device based on FPGA

Abstract

The invention provides a radio frequency tag testing device based on an FPGA, and the device comprises an FPGA test board and a probe card. An electronic tag chip is used for receiving a test commandtransmitted by the FPGA test board, executing the testing operation after decoding, and outputting a testing state after testing so that the FPGA test board carries out the sampling. The FPGA test board receives the test command transmitted by test equipment, completes the command decoding and data coding and transmits the data to the electronic tag chip, and also receives the testing state afterthe testing of the electronic tag chip, and transmits the testing state to the test equipment. The probe card is an electric contact interface of a tested electronic tag chip and the test equipment. The test equipment transmits the test command and data to the FPGA test boar, and determines whether the function of the electronic tag chip is correct or not according to the output testing state of the FPGA test board. The invention also provides a radio frequency tag testing method based on the FPGA.

Description

technical field [0001] The invention relates to the field of verification testing of integrated circuits, in particular to a device for testing radio frequency electronic tags. Background technique [0002] The screening test is an important link to ensure the quality and reliability of the chip. Taking the radio frequency tag chip as an example, the screening test has completed functions such as chip clock calibration (trimming), functional test, burn-in test, and initialization settings. It is highly automated and fully covered by samples. It is currently the most efficient product inspection method to realize the functions of product pre-inspection and application initialization. [0003] In order to realize the screening test function, a certain test circuit needs to be added in the chip design, so as to cooperate with the test equipment to realize various test items, and the execution time of these test items is also directly related to the test technical solution. For...

AI Technical Summary

Problems solved by technology

Due to the limitation of the performance of the test equipment, it is often necessary to complete some functions in the chip under test, which can reduce the requirements for the test equipment, but will increase the logic of the chip test circuit, thereby increasing the chip area

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