Radio frequency tag testing device based on FPGA

A technology of radio frequency tags and testing devices, which is applied in the field of integrated circuit verification testing, can solve the problems of increasing chip test circuit logic, increasing chip area, etc., and achieve the effect of reducing test circuit functions, reducing chip area, and improving processing capabilities
CN107589362AInactive Publication Date: 2018-01-16华大恒芯科技有限公司
2 Cites 5 Cited by

Patent Information

Authority / Receiving Office
CN · China
Current Assignee / Owner
华大恒芯科技有限公司
Publication Date
2018-01-16
Estimated Expiration
Not applicable · inactive patent

Smart Images

  • Figure 1
    Figure 1
  • Figure 2
    Figure 2
  • Figure 3
    Figure 3
Patent Text Reader

Abstract

The invention provides a radio frequency tag testing device based on an FPGA, and the device comprises an FPGA test board and a probe card. An electronic tag chip is used for receiving a test commandtransmitted by the FPGA test board, executing the testing operation after decoding, and outputting a testing state after testing so that the FPGA test board carries out the sampling. The FPGA test board receives the test command transmitted by test equipment, completes the command decoding and data coding and transmits the data to the electronic tag chip, and also receives the testing state afterthe testing of the electronic tag chip, and transmits the testing state to the test equipment. The probe card is an electric contact interface of a tested electronic tag chip and the test equipment. The test equipment transmits the test command and data to the FPGA test boar, and determines whether the function of the electronic tag chip is correct or not according to the output testing state of the FPGA test board. The invention also provides a radio frequency tag testing method based on the FPGA.
Need to check novelty before this filing date? Find Prior Art

Description

technical field

[0001] The invention relates to the field of verification testing of integrated circuits, in particular to a device for testing radio frequency electronic tags. Background technique

[0002] The screening test is an important link to ensure the quality and reliability of the chip. Taking the radio frequency tag chip as an example, the screening test has completed functions such as chip clock calibration (trimming), functional test, burn-in test, and initialization settings. It is highly automated and fully covered by samples. It is currently the most efficient product inspection method to realize the functions of product pre-inspection and application initialization.

[0003] In order to realize the screening test function, a certain test circuit needs to be added in the chip design, so as to cooperate with the test equipment to realize various test items, and the execution time of these test items is also directly related to the test technical solution. For...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More